Full Duplex-Aware Backoff for Improving Channel Utilization in Full Duplex WLANs

Wonjung Kim, Taeyoon Kim, Sohyun Joo, Sangheon Pack

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Even though full duplex (FD) communication, which allows simultaneous transmission and reception on the same frequency channel, is a promising technology to improve the throughput in wireless local area networks (WLANs), it suffers from under-utilization when communication patterns are asymmetric. In this paper, we propose a FD-aware backoff (FD-backoff) scheme to improve the utilization in FD-WLANs. Simulation results show FD-backoff achieves increase of throughput and fairness.

Original languageEnglish
Title of host publication9th International Conference on Information and Communication Technology Convergence
Subtitle of host publicationICT Convergence Powered by Smart Intelligence, ICTC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages366-368
Number of pages3
ISBN (Electronic)9781538650400
DOIs
Publication statusPublished - 2018 Nov 16
Event9th International Conference on Information and Communication Technology Convergence, ICTC 2018 - Jeju Island, Korea, Republic of
Duration: 2018 Oct 172018 Oct 19

Other

Other9th International Conference on Information and Communication Technology Convergence, ICTC 2018
CountryKorea, Republic of
CityJeju Island
Period18/10/1718/10/19

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Keywords

  • channel utilization
  • FD-aware backoff
  • full duplex communications
  • Wireless local area network (WLAN)

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Computer Science Applications
  • Information Systems
  • Information Systems and Management
  • Artificial Intelligence

Cite this

Kim, W., Kim, T., Joo, S., & Pack, S. (2018). Full Duplex-Aware Backoff for Improving Channel Utilization in Full Duplex WLANs. In 9th International Conference on Information and Communication Technology Convergence: ICT Convergence Powered by Smart Intelligence, ICTC 2018 (pp. 366-368). [8539360] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICTC.2018.8539360