Full integration and cell characteristics for 64Mb nonvolatile PRAM

S. H. Lee, Y. N. Hwang, S. Y. Lee, K. C. Ryoo, S. J. Ahn, H. C. Koo, C. W. Jeong, Y. T. Kim, G. H. Koh, G. T. Jeong, H. S. Jeong, Kinam Kim

Research output: Contribution to journalConference articlepeer-review

33 Citations (Scopus)

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Engineering & Materials Science