GaN as a detector of α-particles and neutrons

A. Y. Polyakov, N. B. Smirnov, A. V. Govorkov, In Hwan Lee, S. J. Pearton, N. G. Kolin, I. L. Gazizov, V. M. Zalyetin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

Properties of GaN radiation detectors are analyzed. It is shown that present day epitaxial material is suitable for detection of α-particles with the charge collection efficiency close to 100%. Such detectors can operate at temperatures of at least 60°C and withstand irradiation with reactor neutrons fluences higher than 1015 cm-2. They keep the collection efficiency at 30% even after irradiation with 2×1016 cm-2 neutron fluence. Registration of thermal neutrons with GaN detectors can also be achieved by using 10B converter and the efficiency of registration is determined by the 10B conversion efficiency from neutrons to low energy a-particles.

Original languageEnglish
Title of host publicationQuantum Sensing and Nanophotonic Devices VIII
DOIs
Publication statusPublished - 2011 May 13
EventQuantum Sensing and Nanophotonic Devices VIII - San Francisco, CA, United States
Duration: 2011 Jan 232011 Jan 27

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7945
ISSN (Print)0277-786X

Conference

ConferenceQuantum Sensing and Nanophotonic Devices VIII
CountryUnited States
CitySan Francisco, CA
Period11/1/2311/1/27

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Keywords

  • III-Nitrides
  • alpha-particles
  • deep traps
  • neutron irradiation
  • radiation detectors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Polyakov, A. Y., Smirnov, N. B., Govorkov, A. V., Lee, I. H., Pearton, S. J., Kolin, N. G., Gazizov, I. L., & Zalyetin, V. M. (2011). GaN as a detector of α-particles and neutrons. In Quantum Sensing and Nanophotonic Devices VIII [79451F] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7945). https://doi.org/10.1117/12.869686