TY - JOUR
T1 - GaN nanowires with Au + Ga solid solution grown on an Si(111) substrate by metalorganic chemical vapor deposition
AU - Jang, Eun Su
AU - Ra, Yong Ho
AU - Lee, Young Min
AU - Yun, Seok Hyo
AU - Kim, Dong Wook
AU - Navamathavan, R.
AU - Kim, Jin Soo
AU - Lee, In Hwan
AU - Lee, Cheul Ro
PY - 2009
Y1 - 2009
N2 - In this study, gallium nitride (GaN) nanowire (NW) arrays were grown on a gold-coated Si(111) substrate by metalorganic chemical vapor deposition (MOCVD). The important parameter that decides the density of GaN NWs was considered to be growth temperature. Therefore, in order to study the effect of growth temperature, we grew GaN NWs at various growth temperatures, namely, 800, 850, 900, 950, and 1000 °C, under identical growth conditions. The optimum growth temperature was observed to be 950 °C, and the diameters of the grown GaN NWs were in the range from 80 to 250 nm, and the average length was 3 μm. The surface morphology and optical characterization of the grown GaN NWs were studied by field emission scanning electron microscope (FE-SEM), photoluminescence (PL), and cathodoluminescence (CL), respectively. Energy dispersive X-ray spectroscopy (EDX) analysis confirmed the presence of gallium and nitrogen in the grown NWs. The PL and CL spectra revealed sharp peaks at 366nm with a full width at half maximum (FWHM) of 102meV and at 3.36 eV with a FWHM of 85 meV, respectively, indicating that the grown GaN NWs were highly crystalline.
AB - In this study, gallium nitride (GaN) nanowire (NW) arrays were grown on a gold-coated Si(111) substrate by metalorganic chemical vapor deposition (MOCVD). The important parameter that decides the density of GaN NWs was considered to be growth temperature. Therefore, in order to study the effect of growth temperature, we grew GaN NWs at various growth temperatures, namely, 800, 850, 900, 950, and 1000 °C, under identical growth conditions. The optimum growth temperature was observed to be 950 °C, and the diameters of the grown GaN NWs were in the range from 80 to 250 nm, and the average length was 3 μm. The surface morphology and optical characterization of the grown GaN NWs were studied by field emission scanning electron microscope (FE-SEM), photoluminescence (PL), and cathodoluminescence (CL), respectively. Energy dispersive X-ray spectroscopy (EDX) analysis confirmed the presence of gallium and nitrogen in the grown NWs. The PL and CL spectra revealed sharp peaks at 366nm with a full width at half maximum (FWHM) of 102meV and at 3.36 eV with a FWHM of 85 meV, respectively, indicating that the grown GaN NWs were highly crystalline.
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U2 - 10.1143/JJAP.48.091001
DO - 10.1143/JJAP.48.091001
M3 - Article
AN - SCOPUS:77952725658
SN - 0021-4922
VL - 48
SP - 910011
EP - 910014
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 9 Part 1
ER -