Abstract
In this Letter, we report Ge p-i-n avalanche photodetectors (APD) with low dark current (sub 1 μA below VR = 5 V), low operating voltage (avalanche breakdown voltage = 8-13 V), and high multiplication gain (440-680) by exploiting a point defect healing method (between 600°C and 650°C) and optimizing the doping concentration of the intrinsic region (p-type ∼1017 cm-3). In addition, Raman spectroscopy and electrochemical capacitance voltage analyses were performed to investigate the junction interfaces in more detail. This successful demonstration of Ge p-i-n APD with low dark current, low operating voltage, and high gain is promising for low-power and high-sensitivity Ge PD applications.
Original language | English |
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Pages (from-to) | 4204-4207 |
Number of pages | 4 |
Journal | Optics Letters |
Volume | 39 |
Issue number | 14 |
DOIs | |
Publication status | Published - 2014 Jul 15 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics