Grain-boundary plane orientation dependence of electrical barriers at Σ5 boundaries in SrTiO3

Sung Bo Lee, Jong Heun Lee, Yoon Ho Cho, Doh Yeon Kim, Wilfried Sigle, Fritz Phillipp, Peter A. van Aken

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Dependence of the electrical properties on grain-boundary plane orientation is examined by a combination of high-resolution transmission electron microscopy, impedance spectroscopy, and electron energy-loss spectrometry using two kinds of SrTiO3 Σ5 ([1 0 0]/36.8°) bicrystalline grain boundaries: symmetric (3 1 0) (18.4°/18.4°) and asymmetric (8.4°/28.4°). While the symmetric grain boundary is observed to be straight with the symmetric (3 1 0)//(3 1 0) plane orientation, the asymmetric grain boundary is faceted into symmetric (3 1 0)//(3 1 0) and (2 1 0)//(2 1 0), and asymmetric (1 0 0)//(4 3 0). Grain-boundary impedance is observed only in the asymmetric grain boundary, and the electron energy-loss spectrometry quantification indicates that the asymmetric (1 0 0)//(4 3 0) facets are more oxygen-deficient than the symmetric ones. The results suggest that the asymmetric (1 0 0)//(4 3 0) facets are the most resistive among the three different facets.

Original languageEnglish
Pages (from-to)4993-4997
Number of pages5
JournalActa Materialia
Volume56
Issue number18
DOIs
Publication statusPublished - 2008 Oct

Keywords

  • Annealing
  • Electron energy-loss spectroscopy
  • Grain-boundary structure
  • Strontium titanate
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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