Cd1-xZnxTe is known as promising medical X-ray detector material but CdZnTe as a single crystal is not available in large sizes. As an alternative to single crystal, CdZnTe thick film was grown by vacuum thermal evaporator to 100 μm thickness. The characteristics of thick films were analyzed by XRD. EDS, SEM and current-voltage measurements. Zn composition is x = 0.2 and resistivity is higher than 109 Ω cm.
|Number of pages||5|
|Journal||Physica Status Solidi (B) Basic Research|
|Publication status||Published - 2002 Aug 14|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics