Growth of polycrystalline Cd0.8Zn0.2Te thick films for X-ray detectors

J. S. Kwon, D. Y. Shin, I. S. Choi, H. S. Kim, Kihyun Kim, S. U. Kim, M. J. Park

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Cd1-xZnxTe is known as promising medical X-ray detector material but CdZnTe as a single crystal is not available in large sizes. As an alternative to single crystal, CdZnTe thick film was grown by vacuum thermal evaporator to 100 μm thickness. The characteristics of thick films were analyzed by XRD. EDS, SEM and current-voltage measurements. Zn composition is x = 0.2 and resistivity is higher than 109 Ω cm.

Original languageEnglish
Pages (from-to)1097-1101
Number of pages5
JournalPhysica Status Solidi (B) Basic Research
Volume229
Issue number2
DOIs
Publication statusPublished - 2002 Aug 14

Fingerprint

Thick films
thick films
Single crystals
Detectors
X rays
evaporators
Voltage measurement
detectors
single crystals
Electric current measurement
Evaporators
electrical measurement
Energy dispersive spectroscopy
x rays
Vacuum
vacuum
Scanning electron microscopy
electrical resistivity
scanning electron microscopy
Chemical analysis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Growth of polycrystalline Cd0.8Zn0.2Te thick films for X-ray detectors. / Kwon, J. S.; Shin, D. Y.; Choi, I. S.; Kim, H. S.; Kim, Kihyun; Kim, S. U.; Park, M. J.

In: Physica Status Solidi (B) Basic Research, Vol. 229, No. 2, 14.08.2002, p. 1097-1101.

Research output: Contribution to journalArticle

Kwon, J. S. ; Shin, D. Y. ; Choi, I. S. ; Kim, H. S. ; Kim, Kihyun ; Kim, S. U. ; Park, M. J. / Growth of polycrystalline Cd0.8Zn0.2Te thick films for X-ray detectors. In: Physica Status Solidi (B) Basic Research. 2002 ; Vol. 229, No. 2. pp. 1097-1101.
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