Growth of polycrystalline Cd0.8Zn0.2Te thick films for X-ray detectors

J. S. Kwon, D. Y. Shin, I. S. Choi, H. S. Kim, K. H. Kim, S. U. Kim, M. J. Park

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Cd1-xZnxTe is known as promising medical X-ray detector material but CdZnTe as a single crystal is not available in large sizes. As an alternative to single crystal, CdZnTe thick film was grown by vacuum thermal evaporator to 100 μm thickness. The characteristics of thick films were analyzed by XRD. EDS, SEM and current-voltage measurements. Zn composition is x = 0.2 and resistivity is higher than 109 Ω cm.

Original languageEnglish
Pages (from-to)1097-1101
Number of pages5
JournalPhysica Status Solidi (B) Basic Research
Volume229
Issue number2
DOIs
Publication statusPublished - 2002 Aug 14

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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