High field emission performance of point-typed field emitters fabricated using carbon nanotubes on graphite rods

Yuning Sun, Dong Hoon Shin, Yenan Song, Ki Nam Yun, Cheol Jin Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrated the fabrication of point-typed field emitters by using carbon nanotube films on graphite rods and investigated their field emission properties. The field emitter showed an increased emission current and an improved long-term emission stability after edge polishing process. The highest emission current of the field emitter was increased from 2.0 mA to 4.3 mA (1.1 A/cm2). The field emitter with edge polishing process indicated a nearly negligible degradation of emission current in 20 h. It is considered that the high field emission performance of the field emitter is caused by the suppressed edge emission after edge polishing process. As a result, the field emitters have the higher emission current, lower field enhancement factor, and higher emission stability compared to the pristine emitter.

Original languageEnglish
Title of host publicationTechnical Digest - 2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages160-161
Number of pages2
ISBN (Print)9781479953080
DOIs
Publication statusPublished - 2014 Jan 1
Event2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014 - Engelberg, Switzerland
Duration: 2014 Jul 62014 Jul 10

Other

Other2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014
CountrySwitzerland
CityEngelberg
Period14/7/614/7/10

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Sun, Y., Shin, D. H., Song, Y., Yun, K. N., & Lee, C. J. (2014). High field emission performance of point-typed field emitters fabricated using carbon nanotubes on graphite rods. In Technical Digest - 2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014 (pp. 160-161). [6894793] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVNC.2014.6894793