High-speed and low-voltage performance in a charge-trapping flash memory using a NiO tunnel junction

Yujeong Seo, Ho Myoung An, Hee Dong Kim, In Rok Hwang, Sa Hwan Hong, Bae Ho Park, Tae Geun Kim

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

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Chemical Compounds

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