High-speed dual-beam, crossed line-scanning fluorescence microscope with a point confocal resolution

Hyun Woo Jeong, Hyung Jin Kim, Jung Eun, Seungjin Heo, Mikyoung Lim, Yong Hoon Cho, Beop-Min Kim

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Line-scanning microscopes are often used to overcome the limited scanning speed of conventional point-scanning confocal microscopes, at the cost, however, of spatial resolution. In this paper, we present a dual-beam fluorescence line-scanning microscope that can restore the original confocal resolution. This microscope forms two orthogonal line foci in the object plane with perpendicular scanning directions, which create two line-scan images of the same area. From these images, the real noise and confocal characteristics are analyzed. Based on this information, we developed an image restoration algorithm to produce a final image with spatial resolution comparable to that of a conventional point-scanning confocal microscope. This algorithm was derived with the total variation regularization, and the critical image restoration factor for the algorithm was determined via an iterative process. Our results indicate that the intrinsic resolution limit of line-scanning microscopes can be overcome without subsequent deterioration in spatial resolution.

Original languageEnglish
Pages (from-to)3811-3816
Number of pages6
JournalApplied Optics
Volume54
Issue number12
DOIs
Publication statusPublished - 2015 Apr 20

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microscopes
high speed
fluorescence
scanning
spatial resolution
restoration
deterioration
costs

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

High-speed dual-beam, crossed line-scanning fluorescence microscope with a point confocal resolution. / Jeong, Hyun Woo; Kim, Hyung Jin; Eun, Jung; Heo, Seungjin; Lim, Mikyoung; Cho, Yong Hoon; Kim, Beop-Min.

In: Applied Optics, Vol. 54, No. 12, 20.04.2015, p. 3811-3816.

Research output: Contribution to journalArticle

Jeong, Hyun Woo ; Kim, Hyung Jin ; Eun, Jung ; Heo, Seungjin ; Lim, Mikyoung ; Cho, Yong Hoon ; Kim, Beop-Min. / High-speed dual-beam, crossed line-scanning fluorescence microscope with a point confocal resolution. In: Applied Optics. 2015 ; Vol. 54, No. 12. pp. 3811-3816.
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