Imaging characterization of carbon nanotube tips modified using a focused ion beam

Young Hyun Shin, Jin Won Song, Eung Sug Lee, Chang-Soo Han

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

A carbon nanotube (CNT) tip, which assembled on the sharp end of a Si tip by dielectrophoresis, was structurally modified using focused ion beam (FIB). We described the imaging characterization of the FIB-modified CNT tip in noncontact AFM mode in terms of wear, deep trench accessibility, and imaging resolution. Compared to a conventional Si tip, the FIB-modified CNT tip was superior, especially for prolonged scanning over 10 h. We conclude that modified CNT tips have the potential to obtain high-quality images of nanoscale structures.

Original languageEnglish
Pages (from-to)6872-6877
Number of pages6
JournalApplied Surface Science
Volume253
Issue number16
DOIs
Publication statusPublished - 2007 Jun 15
Externally publishedYes

Fingerprint

Carbon Nanotubes
Focused ion beams
Carbon nanotubes
ion beams
carbon nanotubes
Imaging techniques
Electrophoresis
Image quality
Wear of materials
Scanning
atomic force microscopy
scanning

Keywords

  • Atomic force microscopy
  • Carbon nanotube
  • Imaging
  • Wear

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics

Cite this

Imaging characterization of carbon nanotube tips modified using a focused ion beam. / Shin, Young Hyun; Song, Jin Won; Lee, Eung Sug; Han, Chang-Soo.

In: Applied Surface Science, Vol. 253, No. 16, 15.06.2007, p. 6872-6877.

Research output: Contribution to journalArticle

Shin, Young Hyun ; Song, Jin Won ; Lee, Eung Sug ; Han, Chang-Soo. / Imaging characterization of carbon nanotube tips modified using a focused ion beam. In: Applied Surface Science. 2007 ; Vol. 253, No. 16. pp. 6872-6877.
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