Impact ionization and tunneling operations in charge-plasma dopingless device

Engineering & Materials Science

• Plasma devices 100%
• Impact ionization 86%
• Field effect transistors 29%
• Carrier concentration 13%
• Doping (additives) 10%
• Plasmas 8%
• Electrodes 7%
• Simulators 6%
• Metals 5%

Chemical Compounds

• Impact Ionization 97%
• Tunneling 56%
• Field Effect 41%
• Work Function 15%
• Behavior as Electrode 6%
• Metal 6%
• Reaction Yield 5%

Physics & Astronomy

• field effect transistors 43%
• ionization 38%
• simulators 9%
• diagrams 7%
• electrodes 5%
• profiles 5%
• metals 4%