Impact of series resistance on the operation of junctionless transistors

Dae Young Jeon, So Jeong Park, Mireille Mouis, Sylvain Barraud, Gyu Tae Kim, Gérard Ghibaudo

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

Transconductance (gm) and its derivative (dgm/dVg) of junctionless transistors (JLTs), considered as a possible candidate for future CMOS technology, show their unique operation properties such as bulk neutral and surface accumulation conduction. However, source/drain series resistance (Rsd) causes significant degradation of intrinsic gm and dgm/dVg behavior in JLTs. In this letter, the Rsd effects on the operation of JLTs were investigated in detail and also verified with analytical modeling equations. This work provides helpful information for a better understanding of the operation mechanism of JLTs with de-embedded Rsd effects.

Original languageEnglish
Pages (from-to)103-107
Number of pages5
JournalSolid-State Electronics
Volume129
DOIs
Publication statusPublished - 2017 Mar 1

Keywords

  • Analytical modeling
  • Bulk neutral conduction
  • De-embedded R effects
  • Junctionless transistors (JLTs)
  • Series resistance (R)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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