Impedance-based interpretations in 2-dimensional electron gas conduction formed in the LaAlO3/SrxCa1-xTiO3/SrTiO3 system

Chan Rok Park, Seon Young Moon, Da Hee Park, Shin Ik Kim, Seong Keun Kim, Chong Yun Kang, Seung Hyub Baek, Jung Hae Choi, Jin Sang Kim, Eunsoo Choi, Jin Ha Hwang

Research output: Contribution to journalArticlepeer-review

Abstract

Frequency-dependent impedance spectroscopy was applied to the 2-dimensioanl conduction transport in the LaAlO3/SrxCa1-xTiO3/SrTiO3 system. The 2-dimensional conduction modifies the electrical/dielectric responses of the LaAlO3/SrxCa1-xTiO3/SrTiO3 depending on the magnitude of the interfacial 2-dimensional resistance. The high conduction of the 2-dimensional electron gas (2DEG) layer can be described using a metallic resistor in series with two parallel RC circuits. However, the high resistance of the 2-dimensional layer drives the composite system from a finite low resistor in parallel with the surrounding dielectrics composed of LaAlO3 and SrTiO3 materials to a dielectric capacitor. This change in the resistance of the 2-dimensional layers modifies the overall impedance enabled by the presence of the interfacial layer due to SrxCa1-xTiO3, which alters the charge transport of the 2-dimensional layer from metallic to semiconducting conduction. A noticeable change is observed in the capacitance Bode plots, indicating highly amplified dielectric constants compared with the pristine SrTiO3 substrates and SrxCa1-xTiO3 with a greater Ca content.

Original languageEnglish
Pages (from-to)131-136
Number of pages6
JournalJournal of Physics and Chemistry of Solids
Volume93
DOIs
Publication statusPublished - 2016 Jun
Externally publishedYes

Keywords

  • Electrical/Dielectric Properties
  • Impedance Spectroscopy
  • Interfacial Property
  • Multilayered Oxide System

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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