Impedance spectroscopic estimation of intergranular-phase distribution in CaO · 2SiO2- Or SiO2-in-diffiised 8 mol%-yttria-stabilized zirconia

Young Soo Jung, Jung Hae Choi, Jong Heun Lee, Je Hun Lee, Doh Yeon Kim

Research output: Contribution to journalConference article

6 Citations (Scopus)

Abstract

The grain-boundary resistivity of CaO · 2SiO 2-in-diffused 8 mol%-yttria-stabilized zirconia (8YSZ-CS) or SiO 2-in-diffused 8 mol%-yttria-stabilized zirconia (8YSZ-S) was determined by local impedance spectroscopy using submillimeter-scale electrodes. During sintering, a liquid formed at the top of the 8YSZ penetrates or diffuses into the 8YSZ interior. For CaO · 2SiO2-in-diffused 8YSZ, the grain-boundary resistivity of the specimen surface was observed to be 150 times greater than that of the interior, and grain growth was enhanced near the surface region. In contrast, for SiO2-in-diffused 8YSZ, the near-top surface region did not show enhanced grain growth and its grain-boundary resistivity was only nine times higher than that of the specimen interior.

Original languageEnglish
Pages (from-to)123-127
Number of pages5
JournalSolid State Ionics
Volume175
Issue number1-4
DOIs
Publication statusPublished - 2004 Nov 30
EventFourteenth International Conference on Solid State Ionics - Monterey, CA., United States
Duration: 2003 Jun 222003 Jun 27

Keywords

  • CaO · 2SiO-in-diffused 8YSZ
  • Distribution of siliceous segregation
  • Grain-boundary resistivity
  • O -in-diffused 8YSZ
  • Si
  • Sintering

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Impedance spectroscopic estimation of intergranular-phase distribution in CaO · 2SiO<sub>2</sub>- Or SiO<sub>2</sub>-in-diffiised 8 mol%-yttria-stabilized zirconia'. Together they form a unique fingerprint.

  • Cite this