Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane

Jun Hee Han, Kyu Won Lee, Cheol Eui Lee, Se Hun Kim

Research output: Contribution to journalArticle

Abstract

We have employed impedance spectroscopy in order to study the intrinsic dielectric properties and dynamics of a perfluorosulfonic acid ionomer Nafion (NR-211) membrane. Distinct dielectric relaxation processes involving ionic and chain motions were elucidated by using a frequency-temperature contour plot analysis of the dielectric loss. Furthermore, the low-frequency dielectric loss data that reflect the fractal chain structure of the Nafion system indicated the least topological imperfection of the ionic clusters at the temperature of the maximum loss tangent, Tg = 325 K. An equivalent circuit analysis of the complex impedance manifested a drastic motional slowing down that was apparently associated with a relaxation process around Tg.

Original languageEnglish
Pages (from-to)476-479
Number of pages4
JournalJournal of the Korean Physical Society
Volume72
Issue number3
DOIs
Publication statusPublished - 2018 Feb 1

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dielectric loss
impedance
membranes
acids
tangents
equivalent circuits
spectroscopy
dielectric properties
fractals
plots
low frequencies
temperature
defects

Keywords

  • Dielectric relaxation
  • Impedance spectroscopy
  • Nafion membrane

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane. / Han, Jun Hee; Lee, Kyu Won; Lee, Cheol Eui; Kim, Se Hun.

In: Journal of the Korean Physical Society, Vol. 72, No. 3, 01.02.2018, p. 476-479.

Research output: Contribution to journalArticle

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AB - We have employed impedance spectroscopy in order to study the intrinsic dielectric properties and dynamics of a perfluorosulfonic acid ionomer Nafion (NR-211) membrane. Distinct dielectric relaxation processes involving ionic and chain motions were elucidated by using a frequency-temperature contour plot analysis of the dielectric loss. Furthermore, the low-frequency dielectric loss data that reflect the fractal chain structure of the Nafion system indicated the least topological imperfection of the ionic clusters at the temperature of the maximum loss tangent, Tg = 325 K. An equivalent circuit analysis of the complex impedance manifested a drastic motional slowing down that was apparently associated with a relaxation process around Tg.

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