Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane

Jun Hee Han; Kyu Won Lee; Cheol Eui Lee; Se Hun Kim

doi:10.3938/jkps.72.476

Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane

Jun Hee Han, Kyu Won Lee, Cheol Eui Lee, Se Hun Kim

Department of Physics

Research output: Contribution to journal › Article › peer-review

Abstract

We have employed impedance spectroscopy in order to study the intrinsic dielectric properties and dynamics of a perfluorosulfonic acid ionomer Nafion (NR-211) membrane. Distinct dielectric relaxation processes involving ionic and chain motions were elucidated by using a frequency-temperature contour plot analysis of the dielectric loss. Furthermore, the low-frequency dielectric loss data that reflect the fractal chain structure of the Nafion system indicated the least topological imperfection of the ionic clusters at the temperature of the maximum loss tangent, T_g = 325 K. An equivalent circuit analysis of the complex impedance manifested a drastic motional slowing down that was apparently associated with a relaxation process around T_g.

Original language	English
Pages (from-to)	476-479
Number of pages	4
Journal	Journal of the Korean Physical Society
Volume	72
Issue number	3
DOIs	https://doi.org/10.3938/jkps.72.476
Publication status	Published - 2018 Feb 1

Keywords

Dielectric relaxation
Impedance spectroscopy
Nafion membrane

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.3938/jkps.72.476

Cite this

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title = "Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane",

abstract = "We have employed impedance spectroscopy in order to study the intrinsic dielectric properties and dynamics of a perfluorosulfonic acid ionomer Nafion (NR-211) membrane. Distinct dielectric relaxation processes involving ionic and chain motions were elucidated by using a frequency-temperature contour plot analysis of the dielectric loss. Furthermore, the low-frequency dielectric loss data that reflect the fractal chain structure of the Nafion system indicated the least topological imperfection of the ionic clusters at the temperature of the maximum loss tangent, Tg = 325 K. An equivalent circuit analysis of the complex impedance manifested a drastic motional slowing down that was apparently associated with a relaxation process around Tg.",

keywords = "Dielectric relaxation, Impedance spectroscopy, Nafion membrane",

author = "Han, {Jun Hee} and Lee, {Kyu Won} and Lee, {Cheol Eui} and Kim, {Se Hun}",

note = "Funding Information: This work was supported by the National Research Foundation of Korea (Project No. 2016R1D1A1A 09917003). The measurements at the Korean Basic Science Institute (KBSI) are acknowledged. J.H.H. acknowledges financial support from KBSI grant (D36611) funded by the KBSI. Publisher Copyright: {\textcopyright} 2018, The Korean Physical Society.",

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doi = "10.3938/jkps.72.476",

language = "English",

volume = "72",

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T1 - Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane

AU - Han, Jun Hee

AU - Lee, Kyu Won

AU - Lee, Cheol Eui

AU - Kim, Se Hun

N1 - Funding Information: This work was supported by the National Research Foundation of Korea (Project No. 2016R1D1A1A 09917003). The measurements at the Korean Basic Science Institute (KBSI) are acknowledged. J.H.H. acknowledges financial support from KBSI grant (D36611) funded by the KBSI. Publisher Copyright: © 2018, The Korean Physical Society.

PY - 2018/2/1

Y1 - 2018/2/1

N2 - We have employed impedance spectroscopy in order to study the intrinsic dielectric properties and dynamics of a perfluorosulfonic acid ionomer Nafion (NR-211) membrane. Distinct dielectric relaxation processes involving ionic and chain motions were elucidated by using a frequency-temperature contour plot analysis of the dielectric loss. Furthermore, the low-frequency dielectric loss data that reflect the fractal chain structure of the Nafion system indicated the least topological imperfection of the ionic clusters at the temperature of the maximum loss tangent, Tg = 325 K. An equivalent circuit analysis of the complex impedance manifested a drastic motional slowing down that was apparently associated with a relaxation process around Tg.

AB - We have employed impedance spectroscopy in order to study the intrinsic dielectric properties and dynamics of a perfluorosulfonic acid ionomer Nafion (NR-211) membrane. Distinct dielectric relaxation processes involving ionic and chain motions were elucidated by using a frequency-temperature contour plot analysis of the dielectric loss. Furthermore, the low-frequency dielectric loss data that reflect the fractal chain structure of the Nafion system indicated the least topological imperfection of the ionic clusters at the temperature of the maximum loss tangent, Tg = 325 K. An equivalent circuit analysis of the complex impedance manifested a drastic motional slowing down that was apparently associated with a relaxation process around Tg.

KW - Dielectric relaxation

KW - Impedance spectroscopy

KW - Nafion membrane

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DO - 10.3938/jkps.72.476

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JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - 3

ER -

Impedance Spectroscopy of Dielectric Relaxation in a Perfluorosulfonic Acid Ionomer Nafion Membrane

Abstract

Keywords

ASJC Scopus subject areas

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