Implementation and verification of discriminating algorithm of the optical disc using the side-beams

Sun Mi Lim, Jun Ho Huh, Soo Won Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper presents a new method of discrimination between the normal disc and the rewritable one. The conventional method of disc discrimination, using Focus Error signal, has a heavy fluctuations. To achieve an accurate discrimination, in this paper, the sum of side- beam [1] signal b used for that. A new approach is expected to improve the performance of the disc discrimination as well as to reduce the signal variation almost by 50%. Techniques in this paper are applicable to the all types of optical disc player, such as CD (compact disc), VCD (Video-CD) and DVD (digital versatile disc) and any other optical disc players.

Original languageEnglish
Title of host publication2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages457-460
Number of pages4
ISBN (Electronic)0780377494, 9780780377493
DOIs
Publication statusPublished - 2003
EventIEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003 - Tsimshatsui, Kowloon, Hong Kong
Duration: 2003 Dec 162003 Dec 18

Publication series

Name2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003

Other

OtherIEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003
CountryHong Kong
CityTsimshatsui, Kowloon
Period03/12/1603/12/18

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Lim, S. M., Huh, J. H., & Kim, S. W. (2003). Implementation and verification of discriminating algorithm of the optical disc using the side-beams. In 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003 (pp. 457-460). [1283572] (2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDSSC.2003.1283572