Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing

Zahid Yaqoob, Wonshik Choi, Seungeun Oh, Niyom Lue, Yongkeun Park, Christopher Fang-Yen, Ramachandra R. Dasari, Kamran Badizadegan, Michael S. Feld

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

We report a quantitative phase microscope based on spectral domain optical coherence tomography and line-field illumination. The line illumination allows self phase-referencing method to reject common-mode phase noise. The quantitative phase microscope also features a separate reference arm, permitting the use of high numerical aperture (NA > 1) microscope objectives for high resolution phase measurement at multiple points along the line of illumination. We demonstrate that the path-length sensitivity of the instrument can be as good as 41/pm Hz, which makes it suitable for nanometer scale study of cell motility. We present the detection of natural motions of cell surface and two-dimensional surface profiling of a HeLa cell.

Original languageEnglish
Pages (from-to)10681-10687
Number of pages7
JournalOptics Express
Volume17
Issue number13
DOIs
Publication statusPublished - 2009 Jun 22

Fingerprint

illumination
microscopes
microscopy
cells
locomotion
numerical aperture
tomography
sensitivity
high resolution

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing. / Yaqoob, Zahid; Choi, Wonshik; Oh, Seungeun; Lue, Niyom; Park, Yongkeun; Fang-Yen, Christopher; Dasari, Ramachandra R.; Badizadegan, Kamran; Feld, Michael S.

In: Optics Express, Vol. 17, No. 13, 22.06.2009, p. 10681-10687.

Research output: Contribution to journalArticle

Yaqoob, Z, Choi, W, Oh, S, Lue, N, Park, Y, Fang-Yen, C, Dasari, RR, Badizadegan, K & Feld, MS 2009, 'Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing', Optics Express, vol. 17, no. 13, pp. 10681-10687. https://doi.org/10.1364/OE.17.010681
Yaqoob, Zahid ; Choi, Wonshik ; Oh, Seungeun ; Lue, Niyom ; Park, Yongkeun ; Fang-Yen, Christopher ; Dasari, Ramachandra R. ; Badizadegan, Kamran ; Feld, Michael S. / Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing. In: Optics Express. 2009 ; Vol. 17, No. 13. pp. 10681-10687.
@article{eb4168fb0ed442a3af80d1ebe0f06369,
title = "Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing",
abstract = "We report a quantitative phase microscope based on spectral domain optical coherence tomography and line-field illumination. The line illumination allows self phase-referencing method to reject common-mode phase noise. The quantitative phase microscope also features a separate reference arm, permitting the use of high numerical aperture (NA > 1) microscope objectives for high resolution phase measurement at multiple points along the line of illumination. We demonstrate that the path-length sensitivity of the instrument can be as good as 41/pm Hz, which makes it suitable for nanometer scale study of cell motility. We present the detection of natural motions of cell surface and two-dimensional surface profiling of a HeLa cell.",
author = "Zahid Yaqoob and Wonshik Choi and Seungeun Oh and Niyom Lue and Yongkeun Park and Christopher Fang-Yen and Dasari, {Ramachandra R.} and Kamran Badizadegan and Feld, {Michael S.}",
year = "2009",
month = "6",
day = "22",
doi = "10.1364/OE.17.010681",
language = "English",
volume = "17",
pages = "10681--10687",
journal = "Optics Express",
issn = "1094-4087",
publisher = "The Optical Society",
number = "13",

}

TY - JOUR

T1 - Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing

AU - Yaqoob, Zahid

AU - Choi, Wonshik

AU - Oh, Seungeun

AU - Lue, Niyom

AU - Park, Yongkeun

AU - Fang-Yen, Christopher

AU - Dasari, Ramachandra R.

AU - Badizadegan, Kamran

AU - Feld, Michael S.

PY - 2009/6/22

Y1 - 2009/6/22

N2 - We report a quantitative phase microscope based on spectral domain optical coherence tomography and line-field illumination. The line illumination allows self phase-referencing method to reject common-mode phase noise. The quantitative phase microscope also features a separate reference arm, permitting the use of high numerical aperture (NA > 1) microscope objectives for high resolution phase measurement at multiple points along the line of illumination. We demonstrate that the path-length sensitivity of the instrument can be as good as 41/pm Hz, which makes it suitable for nanometer scale study of cell motility. We present the detection of natural motions of cell surface and two-dimensional surface profiling of a HeLa cell.

AB - We report a quantitative phase microscope based on spectral domain optical coherence tomography and line-field illumination. The line illumination allows self phase-referencing method to reject common-mode phase noise. The quantitative phase microscope also features a separate reference arm, permitting the use of high numerical aperture (NA > 1) microscope objectives for high resolution phase measurement at multiple points along the line of illumination. We demonstrate that the path-length sensitivity of the instrument can be as good as 41/pm Hz, which makes it suitable for nanometer scale study of cell motility. We present the detection of natural motions of cell surface and two-dimensional surface profiling of a HeLa cell.

UR - http://www.scopus.com/inward/record.url?scp=67649261936&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=67649261936&partnerID=8YFLogxK

U2 - 10.1364/OE.17.010681

DO - 10.1364/OE.17.010681

M3 - Article

VL - 17

SP - 10681

EP - 10687

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 13

ER -