Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing

Zahid Yaqoob, Wonshik Choi, Seungeun Oh, Niyom Lue, Yongkeun Park, Christopher Fang-Yen, Ramachandra R. Dasari, Kamran Badizadegan, Michael S. Feld

Research output: Contribution to journalArticlepeer-review

30 Citations (Scopus)

Abstract

We report a quantitative phase microscope based on spectral domain optical coherence tomography and line-field illumination. The line illumination allows self phase-referencing method to reject common-mode phase noise. The quantitative phase microscope also features a separate reference arm, permitting the use of high numerical aperture (NA > 1) microscope objectives for high resolution phase measurement at multiple points along the line of illumination. We demonstrate that the path-length sensitivity of the instrument can be as good as 41/pm Hz, which makes it suitable for nanometer scale study of cell motility. We present the detection of natural motions of cell surface and two-dimensional surface profiling of a HeLa cell.

Original languageEnglish
Pages (from-to)10681-10687
Number of pages7
JournalOptics Express
Volume17
Issue number13
DOIs
Publication statusPublished - 2009 Jun 22

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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