Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing

Zahid Yaqoob, Wonshik Choi, Seungeun Oh, Niyom Lue, Yongkeun Park, Christopher Fang-Yen, Ramachandra R. Dasari, Kamran Badizadegan, Michael S. Feld

Research output: Contribution to journalArticle

29 Citations (Scopus)

Abstract

We report a quantitative phase microscope based on spectral domain optical coherence tomography and line-field illumination. The line illumination allows self phase-referencing method to reject common-mode phase noise. The quantitative phase microscope also features a separate reference arm, permitting the use of high numerical aperture (NA > 1) microscope objectives for high resolution phase measurement at multiple points along the line of illumination. We demonstrate that the path-length sensitivity of the instrument can be as good as 41/pm Hz, which makes it suitable for nanometer scale study of cell motility. We present the detection of natural motions of cell surface and two-dimensional surface profiling of a HeLa cell.

Original languageEnglish
Pages (from-to)10681-10687
Number of pages7
JournalOptics Express
Volume17
Issue number13
DOIs
Publication statusPublished - 2009 Jun 22

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing'. Together they form a unique fingerprint.

  • Cite this

    Yaqoob, Z., Choi, W., Oh, S., Lue, N., Park, Y., Fang-Yen, C., Dasari, R. R., Badizadegan, K., & Feld, M. S. (2009). Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing. Optics Express, 17(13), 10681-10687. https://doi.org/10.1364/OE.17.010681