Improved quantitative analysis of Cu(In,Ga)Se2 thin films using MCs+-SIMS depth profiling

Jihye Lee, Seon Hee Kim, Kang Bong Lee, Byoung Koun Min, Yeonhee Lee

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Improved quantitative analysis of Cu(In,Ga)Se<sub>2</sub> thin films using MCs<sup>+</sup>-SIMS depth profiling'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science