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Dive into the research topics of 'Improved Reliability of 278 nm Deep Ultraviolet AlGaN-Based Flip-Chip Light Emitting Diodes by Using ITO/Al Contact'. Together they form a unique fingerprint.- Sort by
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Woong Sun Yum, Sang Youl Lee, Hyun Soo Lim, Rak Jun Choi, Jeong Tak Oh, Hwan Hee Jeong, Tae Yeon Seong
Research output: Contribution to journal › Article › peer-review