Improved Reliability of 278 nm Deep Ultraviolet AlGaN-Based Flip-Chip Light Emitting Diodes by Using ITO/Al Contact

Woong Sun Yum, Sang Youl Lee, Hyun Soo Lim, Rak Jun Choi, Jeong Tak Oh, Hwan Hee Jeong, Tae Yeon Seong

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Engineering & Materials Science

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