Impurities behaviors in indium iodide materials

Sohee Leem; Seokjin Hwang; Hwanseung Yu; Yongsu Yoon; Kihyun Kim

doi:10.1109/TNS.2018.2796388

Impurities behaviors in indium iodide materials

Sohee Leem, Seokjin Hwang, Hwanseung Yu, Yongsu Yoon, Kihyun Kim

School of Health and Environmental Science

Research output: Contribution to journal › Article › peer-review

Abstract

Environmentally friendly 99.998%-pure indium iodide (InI), one candidate materials for the room-temperature operating radiation detector, was purified more than 250 times using the zone-refining method to reduce the impurities. Segregation coefficient of major positive and negative impurities of the purified InI ingot was analyzed using time-of-flight secondary ion mass spectroscopy. Electrical and spectroscopic properties of the purified Pd/InI/Pd detector were also determined. Planar Pd/InI/Pd detector showed the 59.5-keV gamma peak of Am-241 clearly. However, low-energy gamma peaks were buried in the noise. Mechanical or electrical degradation under an ambient condition was not observed for six months. Electrical resistivity and electron mobility-lifetime product of the multiple-refined InI were 4× 10¹¹,Ωcm and 1.3× 10^-3,cm²/V, respectively.

Original language	English
Pages (from-to)	909-912
Number of pages	4
Journal	IEEE Transactions on Nuclear Science
Volume	65
Issue number	3
DOIs	https://doi.org/10.1109/TNS.2018.2796388
Publication status	Published - 2018 Mar

Keywords

Indium iodide (InI)
Pd/InI/Pd
pulse-height measurements
radiation detectors
segregation coefficients
time-of-flight secondary ion mass spectroscopy (ToF-SIMS)
zone refining

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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@article{61b43820a0864e909930a086f63ca8d8,

title = "Impurities behaviors in indium iodide materials",

abstract = "Environmentally friendly 99.998%-pure indium iodide (InI), one candidate materials for the room-temperature operating radiation detector, was purified more than 250 times using the zone-refining method to reduce the impurities. Segregation coefficient of major positive and negative impurities of the purified InI ingot was analyzed using time-of-flight secondary ion mass spectroscopy. Electrical and spectroscopic properties of the purified Pd/InI/Pd detector were also determined. Planar Pd/InI/Pd detector showed the 59.5-keV gamma peak of Am-241 clearly. However, low-energy gamma peaks were buried in the noise. Mechanical or electrical degradation under an ambient condition was not observed for six months. Electrical resistivity and electron mobility-lifetime product of the multiple-refined InI were 4× 1011,Ωcm and 1.3× 10-3,cm2/V, respectively.",

keywords = "Indium iodide (InI), Pd/InI/Pd, pulse-height measurements, radiation detectors, segregation coefficients, time-of-flight secondary ion mass spectroscopy (ToF-SIMS), zone refining",

author = "Sohee Leem and Seokjin Hwang and Hwanseung Yu and Yongsu Yoon and Kihyun Kim",

note = "Funding Information: Manuscript received July 17, 2017; revised November 6, 2017; accepted January 12, 2018. Date of publication January 23, 2018; date of current version March 14, 2018. This work was supported in part by Korea University under grant K1605381 and in part by the National Research Foundation of Korea through the Ministry of Science, ICT, and Future Planning, South Korea, under Grant NRF-2015M2B2A9032788. (Corresponding author: Kihyun Kim.) S. Leem is with the School of Health and Environmental Science, Korea University, Seoul 02841, South Korea.",

year = "2018",

month = mar,

doi = "10.1109/TNS.2018.2796388",

language = "English",

volume = "65",

pages = "909--912",

journal = "IEEE Transactions on Nuclear Science",

issn = "0018-9499",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "3",

}

TY - JOUR

T1 - Impurities behaviors in indium iodide materials

AU - Leem, Sohee

AU - Hwang, Seokjin

AU - Yu, Hwanseung

AU - Yoon, Yongsu

AU - Kim, Kihyun

N1 - Funding Information: Manuscript received July 17, 2017; revised November 6, 2017; accepted January 12, 2018. Date of publication January 23, 2018; date of current version March 14, 2018. This work was supported in part by Korea University under grant K1605381 and in part by the National Research Foundation of Korea through the Ministry of Science, ICT, and Future Planning, South Korea, under Grant NRF-2015M2B2A9032788. (Corresponding author: Kihyun Kim.) S. Leem is with the School of Health and Environmental Science, Korea University, Seoul 02841, South Korea.

PY - 2018/3

Y1 - 2018/3

N2 - Environmentally friendly 99.998%-pure indium iodide (InI), one candidate materials for the room-temperature operating radiation detector, was purified more than 250 times using the zone-refining method to reduce the impurities. Segregation coefficient of major positive and negative impurities of the purified InI ingot was analyzed using time-of-flight secondary ion mass spectroscopy. Electrical and spectroscopic properties of the purified Pd/InI/Pd detector were also determined. Planar Pd/InI/Pd detector showed the 59.5-keV gamma peak of Am-241 clearly. However, low-energy gamma peaks were buried in the noise. Mechanical or electrical degradation under an ambient condition was not observed for six months. Electrical resistivity and electron mobility-lifetime product of the multiple-refined InI were 4× 1011,Ωcm and 1.3× 10-3,cm2/V, respectively.

AB - Environmentally friendly 99.998%-pure indium iodide (InI), one candidate materials for the room-temperature operating radiation detector, was purified more than 250 times using the zone-refining method to reduce the impurities. Segregation coefficient of major positive and negative impurities of the purified InI ingot was analyzed using time-of-flight secondary ion mass spectroscopy. Electrical and spectroscopic properties of the purified Pd/InI/Pd detector were also determined. Planar Pd/InI/Pd detector showed the 59.5-keV gamma peak of Am-241 clearly. However, low-energy gamma peaks were buried in the noise. Mechanical or electrical degradation under an ambient condition was not observed for six months. Electrical resistivity and electron mobility-lifetime product of the multiple-refined InI were 4× 1011,Ωcm and 1.3× 10-3,cm2/V, respectively.

KW - Indium iodide (InI)

KW - Pd/InI/Pd

KW - pulse-height measurements

KW - radiation detectors

KW - segregation coefficients

KW - time-of-flight secondary ion mass spectroscopy (ToF-SIMS)

KW - zone refining

UR - http://www.scopus.com/inward/record.url?scp=85040905007&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85040905007&partnerID=8YFLogxK

U2 - 10.1109/TNS.2018.2796388

DO - 10.1109/TNS.2018.2796388

M3 - Article

AN - SCOPUS:85040905007

VL - 65

SP - 909

EP - 912

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

SN - 0018-9499

IS - 3

ER -