TY - JOUR
T1 - Impurities behaviors in indium iodide materials
AU - Leem, Sohee
AU - Hwang, Seokjin
AU - Yu, Hwanseung
AU - Yoon, Yongsu
AU - Kim, Kihyun
N1 - Funding Information:
Manuscript received July 17, 2017; revised November 6, 2017; accepted January 12, 2018. Date of publication January 23, 2018; date of current version March 14, 2018. This work was supported in part by Korea University under grant K1605381 and in part by the National Research Foundation of Korea through the Ministry of Science, ICT, and Future Planning, South Korea, under Grant NRF-2015M2B2A9032788. (Corresponding author: Kihyun Kim.) S. Leem is with the School of Health and Environmental Science, Korea University, Seoul 02841, South Korea.
PY - 2018/3
Y1 - 2018/3
N2 - Environmentally friendly 99.998%-pure indium iodide (InI), one candidate materials for the room-temperature operating radiation detector, was purified more than 250 times using the zone-refining method to reduce the impurities. Segregation coefficient of major positive and negative impurities of the purified InI ingot was analyzed using time-of-flight secondary ion mass spectroscopy. Electrical and spectroscopic properties of the purified Pd/InI/Pd detector were also determined. Planar Pd/InI/Pd detector showed the 59.5-keV gamma peak of Am-241 clearly. However, low-energy gamma peaks were buried in the noise. Mechanical or electrical degradation under an ambient condition was not observed for six months. Electrical resistivity and electron mobility-lifetime product of the multiple-refined InI were 4× 1011,Ωcm and 1.3× 10-3,cm2/V, respectively.
AB - Environmentally friendly 99.998%-pure indium iodide (InI), one candidate materials for the room-temperature operating radiation detector, was purified more than 250 times using the zone-refining method to reduce the impurities. Segregation coefficient of major positive and negative impurities of the purified InI ingot was analyzed using time-of-flight secondary ion mass spectroscopy. Electrical and spectroscopic properties of the purified Pd/InI/Pd detector were also determined. Planar Pd/InI/Pd detector showed the 59.5-keV gamma peak of Am-241 clearly. However, low-energy gamma peaks were buried in the noise. Mechanical or electrical degradation under an ambient condition was not observed for six months. Electrical resistivity and electron mobility-lifetime product of the multiple-refined InI were 4× 1011,Ωcm and 1.3× 10-3,cm2/V, respectively.
KW - Indium iodide (InI)
KW - Pd/InI/Pd
KW - pulse-height measurements
KW - radiation detectors
KW - segregation coefficients
KW - time-of-flight secondary ion mass spectroscopy (ToF-SIMS)
KW - zone refining
UR - http://www.scopus.com/inward/record.url?scp=85040905007&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85040905007&partnerID=8YFLogxK
U2 - 10.1109/TNS.2018.2796388
DO - 10.1109/TNS.2018.2796388
M3 - Article
AN - SCOPUS:85040905007
VL - 65
SP - 909
EP - 912
JO - IEEE Transactions on Nuclear Science
JF - IEEE Transactions on Nuclear Science
SN - 0018-9499
IS - 3
ER -