Abstract
Environmentally friendly 99.998%-pure indium iodide (InI), one candidate materials for the room-temperature operating radiation detector, was purified more than 250 times using the zone-refining method to reduce the impurities. Segregation coefficient of major positive and negative impurities of the purified InI ingot was analyzed using time-of-flight secondary ion mass spectroscopy. Electrical and spectroscopic properties of the purified Pd/InI/Pd detector were also determined. Planar Pd/InI/Pd detector showed the 59.5-keV gamma peak of Am-241 clearly. However, low-energy gamma peaks were buried in the noise. Mechanical or electrical degradation under an ambient condition was not observed for six months. Electrical resistivity and electron mobility-lifetime product of the multiple-refined InI were 4× 1011,Ωcm and 1.3× 10-3,cm2/V, respectively.
Original language | English |
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Pages (from-to) | 909-912 |
Number of pages | 4 |
Journal | IEEE Transactions on Nuclear Science |
Volume | 65 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2018 Mar |
Keywords
- Indium iodide (InI)
- Pd/InI/Pd
- pulse-height measurements
- radiation detectors
- segregation coefficients
- time-of-flight secondary ion mass spectroscopy (ToF-SIMS)
- zone refining
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Electrical and Electronic Engineering