In depth characterization of electron transport in 14 nm FD-SOI CMOS devices

Ming Shi, Minju Shin, Mireille Mouis, Antoine Cros, Emmanuel Josse, Gyu Tae Kim, Gérard Ghibaudo

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Fingerprint

Dive into the research topics of 'In depth characterization of electron transport in 14 nm FD-SOI CMOS devices'. Together they form a unique fingerprint.

Physics & Astronomy

Chemical Compounds

Engineering & Materials Science