In depth characterization of hole transport in 14nm FD-SOI pMOS devices

M. Shin, M. Shi, M. Mouis, A. Cros, E. Josse, G. T. Kim, G. Ghibaudo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'In depth characterization of hole transport in 14nm FD-SOI pMOS devices'. Together they form a unique fingerprint.

Engineering & Materials Science