Industrial experience with cycle error computation of cycle-accurate transaction level models

Junghee Lee, Joonhwan Yi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Transaction level modeling is gaining increasing popularity with the increasing design complexity of the system-on-a-chip. Transaction level models are frequently built from existing register transfer level models, which usually cause cycle errors. Measurable indicators of cycle errors are necessary, and their definitions are important. This paper presents the challenges in cycle error computation and our proposed method, although its effectiveness has not been proved formally. The main contribution of our study is to report an industrial experience with cycle error computation.

Original languageEnglish
Title of host publicationProceedings - 20th Anniversary IEEE International SOC Conference
Pages155-158
Number of pages4
DOIs
Publication statusPublished - 2007
Event20th Anniversary IEEE International SOC Conference - Hsinchu, Taiwan, Province of China
Duration: 2007 Sep 262007 Sep 29

Publication series

NameProceedings - 20th Anniversary IEEE International SOC Conference

Conference

Conference20th Anniversary IEEE International SOC Conference
CountryTaiwan, Province of China
CityHsinchu
Period07/9/2607/9/29

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Lee, J., & Yi, J. (2007). Industrial experience with cycle error computation of cycle-accurate transaction level models. In Proceedings - 20th Anniversary IEEE International SOC Conference (pp. 155-158). [4545448] (Proceedings - 20th Anniversary IEEE International SOC Conference). https://doi.org/10.1109/SOCC.2007.4545448