TY - JOUR
T1 - Influence of air-oxidation on rectification in thiol-based molecular monolayers
AU - Kong, Gyu Don
AU - Yoon, Hyo Jae
N1 - Funding Information:
This research was supported by the Basic Science Research Program through the NRF of Korea funded by the Ministry of Science, ICT,&Future Planning (NRF-2014R1A1A1002938) and the Ministry of Education (NRF20100020209).
Publisher Copyright:
© 2016 The Electrochemical Society. All rights reserved.
PY - 2016
Y1 - 2016
N2 - Spontaneous structural degradation processes occurring on metallic surfaces upon exposure to air-self-passivation-are well known for conventional silicon-based electronic materials; however, the effect of the analogous process for organic materials inside molecular electronic devices on their electrical behavior is rarely understood. Here, we show the influence of air-oxidation on molecular rectification in large-area junctions formed from a self-assembled monolayer (SAM) comprising 2,2′-bipyridyl terminated n-alkanethiolate. Upon exposure to air, the rectification ratio decreases as a function of air-exposure time and disappears in ∼3 h. Structural analyses of the SAM using X-ray photoelectron spectroscopy and wet electrochemistry, as well as several physical-organic studies indicate that the decrease of rectification over time stems from structural degradation, facilitated by light, of the thiolate anchoring group of the SAM.
AB - Spontaneous structural degradation processes occurring on metallic surfaces upon exposure to air-self-passivation-are well known for conventional silicon-based electronic materials; however, the effect of the analogous process for organic materials inside molecular electronic devices on their electrical behavior is rarely understood. Here, we show the influence of air-oxidation on molecular rectification in large-area junctions formed from a self-assembled monolayer (SAM) comprising 2,2′-bipyridyl terminated n-alkanethiolate. Upon exposure to air, the rectification ratio decreases as a function of air-exposure time and disappears in ∼3 h. Structural analyses of the SAM using X-ray photoelectron spectroscopy and wet electrochemistry, as well as several physical-organic studies indicate that the decrease of rectification over time stems from structural degradation, facilitated by light, of the thiolate anchoring group of the SAM.
UR - http://www.scopus.com/inward/record.url?scp=84982683401&partnerID=8YFLogxK
U2 - 10.1149/2.0091609jes
DO - 10.1149/2.0091609jes
M3 - Article
AN - SCOPUS:84982683401
SN - 0013-4651
VL - 163
SP - G115-G121
JO - Journal of the Electrochemical Society
JF - Journal of the Electrochemical Society
IS - 9
ER -