Influence of anatase-rutile phase transformation on dielectric properties of sol-gel derived TiO2 thin films

Jun Hong Noh, Hyun Suk Jung, Jung Hong No, Jeong Ryeol Kim, Kug Sun Hong

Research output: Contribution to journalArticle

61 Citations (Scopus)

Abstract

The phase transformation behavior and resulting dielectric properties of sol-gel derived TiO2 thin films were investigated. Thin films showed a typical behavior of mixture systems during the phase transformation; a kinetic investigation on the isothermal curve of pre-crystallized thin films revealed that the phase transformation was a first-order reaction with an Avrami time component of 1. Dielectric constants of TiO2 thin films increased with the increasing amount of the rutile phase while the dielectric losses showed the opposite relationship. From a fitting process using the parallel mixing rule, dielectric constants of two end members of the mixture system were calculated to be 41.4 and 145.2 for the pure anatase and rutile phase thin films, respectively.

Original languageEnglish
Pages (from-to)447-451
Number of pages5
JournalJournal of Electroceramics
Volume16
Issue number4
DOIs
Publication statusPublished - 2006 Jul 1
Externally publishedYes

Fingerprint

anatase
rutile
Dielectric properties
Titanium dioxide
Sol-gels
phase transformations
dielectric properties
Phase transitions
gels
Thin films
thin films
Permittivity
permittivity
Dielectric losses
dielectric loss
titanium dioxide
Kinetics
kinetics
curves

Keywords

  • Dielectric property
  • Phase transformation
  • Sol-gel method
  • Thin film
  • TiO

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Mechanics of Materials
  • Materials Chemistry
  • Electrical and Electronic Engineering

Cite this

Influence of anatase-rutile phase transformation on dielectric properties of sol-gel derived TiO2 thin films. / Noh, Jun Hong; Jung, Hyun Suk; No, Jung Hong; Kim, Jeong Ryeol; Hong, Kug Sun.

In: Journal of Electroceramics, Vol. 16, No. 4, 01.07.2006, p. 447-451.

Research output: Contribution to journalArticle

Noh, Jun Hong ; Jung, Hyun Suk ; No, Jung Hong ; Kim, Jeong Ryeol ; Hong, Kug Sun. / Influence of anatase-rutile phase transformation on dielectric properties of sol-gel derived TiO2 thin films. In: Journal of Electroceramics. 2006 ; Vol. 16, No. 4. pp. 447-451.
@article{e1c2010ce4fe470986b26d2b664a1226,
title = "Influence of anatase-rutile phase transformation on dielectric properties of sol-gel derived TiO2 thin films",
abstract = "The phase transformation behavior and resulting dielectric properties of sol-gel derived TiO2 thin films were investigated. Thin films showed a typical behavior of mixture systems during the phase transformation; a kinetic investigation on the isothermal curve of pre-crystallized thin films revealed that the phase transformation was a first-order reaction with an Avrami time component of 1. Dielectric constants of TiO2 thin films increased with the increasing amount of the rutile phase while the dielectric losses showed the opposite relationship. From a fitting process using the parallel mixing rule, dielectric constants of two end members of the mixture system were calculated to be 41.4 and 145.2 for the pure anatase and rutile phase thin films, respectively.",
keywords = "Dielectric property, Phase transformation, Sol-gel method, Thin film, TiO",
author = "Noh, {Jun Hong} and Jung, {Hyun Suk} and No, {Jung Hong} and Kim, {Jeong Ryeol} and Hong, {Kug Sun}",
year = "2006",
month = "7",
day = "1",
doi = "10.1007/s10832-006-9895-z",
language = "English",
volume = "16",
pages = "447--451",
journal = "Journal of Electroceramics",
issn = "1385-3449",
publisher = "Springer Netherlands",
number = "4",

}

TY - JOUR

T1 - Influence of anatase-rutile phase transformation on dielectric properties of sol-gel derived TiO2 thin films

AU - Noh, Jun Hong

AU - Jung, Hyun Suk

AU - No, Jung Hong

AU - Kim, Jeong Ryeol

AU - Hong, Kug Sun

PY - 2006/7/1

Y1 - 2006/7/1

N2 - The phase transformation behavior and resulting dielectric properties of sol-gel derived TiO2 thin films were investigated. Thin films showed a typical behavior of mixture systems during the phase transformation; a kinetic investigation on the isothermal curve of pre-crystallized thin films revealed that the phase transformation was a first-order reaction with an Avrami time component of 1. Dielectric constants of TiO2 thin films increased with the increasing amount of the rutile phase while the dielectric losses showed the opposite relationship. From a fitting process using the parallel mixing rule, dielectric constants of two end members of the mixture system were calculated to be 41.4 and 145.2 for the pure anatase and rutile phase thin films, respectively.

AB - The phase transformation behavior and resulting dielectric properties of sol-gel derived TiO2 thin films were investigated. Thin films showed a typical behavior of mixture systems during the phase transformation; a kinetic investigation on the isothermal curve of pre-crystallized thin films revealed that the phase transformation was a first-order reaction with an Avrami time component of 1. Dielectric constants of TiO2 thin films increased with the increasing amount of the rutile phase while the dielectric losses showed the opposite relationship. From a fitting process using the parallel mixing rule, dielectric constants of two end members of the mixture system were calculated to be 41.4 and 145.2 for the pure anatase and rutile phase thin films, respectively.

KW - Dielectric property

KW - Phase transformation

KW - Sol-gel method

KW - Thin film

KW - TiO

UR - http://www.scopus.com/inward/record.url?scp=33750575011&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33750575011&partnerID=8YFLogxK

U2 - 10.1007/s10832-006-9895-z

DO - 10.1007/s10832-006-9895-z

M3 - Article

AN - SCOPUS:33750575011

VL - 16

SP - 447

EP - 451

JO - Journal of Electroceramics

JF - Journal of Electroceramics

SN - 1385-3449

IS - 4

ER -