Infrared spectrum of the silicon hydride cation SiH7PLU

Yibin Cao, Jong H. Choi, Bernd Michael Haas, Matthew S. Johnson, Mitchio Okumura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Silanium ions are an important class of hypervalent molecules, and the determination of their structure will yield insights into the nature of nonclassical bonding and provide a contrast to the bonding in carbonium ions. We report the infrared spectrum of the mass-selected silicon hydride cluster ion 28SiH7+, detected by vibrational predissociation spectroscopy. Silanium ions were formed in a pulsed high pressure glow discharge and cooled by the subsequent supersonic expansion. Photodissociation spectra were obtained using a tandem time-of-flight mass spectrometer: SiH7+ ions were mass-selected and excited by a tunable infrared laser. The resulting photofragments were detected using a reflectron as a mass analyzer. We observed a vibrational band at 3865 cm-1, which was the only one observed from 3500 cm-1 to 4200 cm-1. This result suggests that the molecule might form a symmetric complex with the structure H 2·SiH3+·H2, in contrast to the species CH 7+, which has the structure CH5+·H2.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages326-331
Number of pages6
ISBN (Print)0819410853
Publication statusPublished - 1993

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1858
ISSN (Print)0277-786X

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Cao, Y., Choi, J. H., Haas, B. M., Johnson, M. S., & Okumura, M. (1993). Infrared spectrum of the silicon hydride cation SiH7PLU. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 326-331). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1858). Publ by Int Soc for Optical Engineering.