Inspection of 2-D objects using pattern matching method

Min Hong Han, Dong Sik Jang, Joseph Foster

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

A pattern matching scheme is developed for the inspection of objects in industrial environment. The inspection includes dimensional verification and shape matching which compares a 2-dimensional image of an object to a pattern image. The method proves to be computationally efficient and accurate for real time application.

Original languageEnglish
Pages (from-to)567-575
Number of pages9
JournalPattern Recognition
Volume22
Issue number5
Publication statusPublished - 1989 Dec 1
Externally publishedYes

Fingerprint

Pattern matching
Inspection

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Signal Processing
  • Electrical and Electronic Engineering

Cite this

Inspection of 2-D objects using pattern matching method. / Han, Min Hong; Jang, Dong Sik; Foster, Joseph.

In: Pattern Recognition, Vol. 22, No. 5, 01.12.1989, p. 567-575.

Research output: Contribution to journalArticle

Han, MH, Jang, DS & Foster, J 1989, 'Inspection of 2-D objects using pattern matching method', Pattern Recognition, vol. 22, no. 5, pp. 567-575.
Han, Min Hong ; Jang, Dong Sik ; Foster, Joseph. / Inspection of 2-D objects using pattern matching method. In: Pattern Recognition. 1989 ; Vol. 22, No. 5. pp. 567-575.
@article{13630514f04f483e90ca0a9c4b2ddb6e,
title = "Inspection of 2-D objects using pattern matching method",
abstract = "A pattern matching scheme is developed for the inspection of objects in industrial environment. The inspection includes dimensional verification and shape matching which compares a 2-dimensional image of an object to a pattern image. The method proves to be computationally efficient and accurate for real time application.",
keywords = "Axis of least inertia, Pattern matching, Polygon approximation, Vision inspection",
author = "Han, {Min Hong} and Jang, {Dong Sik} and Joseph Foster",
year = "1989",
month = "12",
day = "1",
language = "English",
volume = "22",
pages = "567--575",
journal = "Pattern Recognition",
issn = "0031-3203",
publisher = "Elsevier Limited",
number = "5",

}

TY - JOUR

T1 - Inspection of 2-D objects using pattern matching method

AU - Han, Min Hong

AU - Jang, Dong Sik

AU - Foster, Joseph

PY - 1989/12/1

Y1 - 1989/12/1

N2 - A pattern matching scheme is developed for the inspection of objects in industrial environment. The inspection includes dimensional verification and shape matching which compares a 2-dimensional image of an object to a pattern image. The method proves to be computationally efficient and accurate for real time application.

AB - A pattern matching scheme is developed for the inspection of objects in industrial environment. The inspection includes dimensional verification and shape matching which compares a 2-dimensional image of an object to a pattern image. The method proves to be computationally efficient and accurate for real time application.

KW - Axis of least inertia

KW - Pattern matching

KW - Polygon approximation

KW - Vision inspection

UR - http://www.scopus.com/inward/record.url?scp=0024939487&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0024939487&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0024939487

VL - 22

SP - 567

EP - 575

JO - Pattern Recognition

JF - Pattern Recognition

SN - 0031-3203

IS - 5

ER -