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Interface trap density of gate-all-around silicon nanowire field-effect transistors with TiN gate: Extraction and compact model
Faraz Najam, Yun Seop Yu, Keun Hwi Cho, Kyoung Hwan Yeo, Dong Won Kim, Jong Seung Hwang, Sansig Kim, Sung Woo Hwang
Research output: Contribution to journal › Article › peer-review
16
Citations
(Scopus)