Interferometric Scattering Microscopy with Polarization-Selective Dual Detection Scheme: Capturing the Orientational Information of Anisotropic Nanometric Objects

Il Buem Lee, Hyeon Min Moon, Jong Hyeon Joo, Kyoung Hoon Kim, Seok Cheol Hong, Minhaeng Cho

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

Single particle tracking is a powerful technique to reveal an underlying principle of microscopic phenomena. Here we report an optical microscopy technique, polarization-selective interferometric scattering microscopy that enables us to capture rotational as well as positional information of nano-scale objects. This technique grants all the merits of interferometric scattering microscopy and provides a further advantage of the capability of determining the orientation of single nanoscopic objects in a straightforward and facile way. We anticipate that this technique would be of critical use in rotational tracking of a single anisotropic particle or biological system in the nanoscopic world.

Original languageEnglish
JournalUnknown Journal
DOIs
Publication statusAccepted/In press - 2017 Aug 7

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biotechnology
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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