Interwall support in double-walled carbon nanotubes studied by scanning tunneling microscopy

Min Hwan Park, Jae Won Jang, Cheol Eui Lee, Cheol Jin Lee

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Atomically resolved room temperature scanning tunneling microscopy images of carbon nanotubes were obtained, and actual values of the nanotube dimensions were estimated from a line profile fitting analysis. It was found that the cross sectional deformation induced by the van der Waals forces between the CNTs and the substrate is much smaller in the double-walled carbon nanotubes than in the single-walled nanotubes.

Original languageEnglish
Article number023110
JournalApplied Physics Letters
Issue number2
Publication statusPublished - 2005 Jan 10


ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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