Investigation on the valence state of Te ions in the Bi6Ti5TeO22 thin film using X-ray photoelectron spectroscopy

Chang Hak Choi, Joo Young Choi, Kyung Hoon Cho, Myong Jae Yoo, Jae Hong Choi, Sahn Nahm, Chong-Yun Kang, Seok Jin Yoon, Jong Hee Kim

Research output: Contribution to journalArticle

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Abstract

Bi6Ti5TeO22 (BTT) thin films were grown on a Pt/Ti/SiO2/Si(1 0 0) substrate under various conditions and the valence state of the Te ion was investigated. For the BTT films grown at 300 °C, most of the Te ions existed as Te4+ ions. However, for the 10 mol% Mn-added BTT films grown at 300 °C, Te6+ ions were found even in the film grown under low oxygen partial pressure (OPP) and their number increased with increasing OPP. This increase was attributed to the presence of Mn2+ ions, which assisted the transition of Te4+ ions to Te6+ ions in order to maintain the charge balance of the Ti4+ sites. Furthermore, in the films grown at 300 °C under a high OPP of 80.0 Pa and subsequently annealed at 600 °C under a high oxygen pressure of 101 kPa, most of the Te ions existed as Te6+ ions. However, for the film grown at 300 °C under low OPP, even though the film was annealed under a high oxygen pressure of 101 kPa, only a few of Te6+ ions were formed, whereas most of Te ions remained as the Te4+ ions.

Original languageEnglish
Pages (from-to)517-520
Number of pages4
JournalJournal of the European Ceramic Society
Volume30
Issue number2
DOIs
Publication statusPublished - 2010 Jan 1

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X ray photoelectron spectroscopy
Ions
Thin films
Oxygen
Partial pressure
Substrates

Keywords

  • BiTiTeO
  • Thin film
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

Cite this

Investigation on the valence state of Te ions in the Bi6Ti5TeO22 thin film using X-ray photoelectron spectroscopy. / Choi, Chang Hak; Choi, Joo Young; Cho, Kyung Hoon; Yoo, Myong Jae; Choi, Jae Hong; Nahm, Sahn; Kang, Chong-Yun; Yoon, Seok Jin; Kim, Jong Hee.

In: Journal of the European Ceramic Society, Vol. 30, No. 2, 01.01.2010, p. 517-520.

Research output: Contribution to journalArticle

Choi, Chang Hak ; Choi, Joo Young ; Cho, Kyung Hoon ; Yoo, Myong Jae ; Choi, Jae Hong ; Nahm, Sahn ; Kang, Chong-Yun ; Yoon, Seok Jin ; Kim, Jong Hee. / Investigation on the valence state of Te ions in the Bi6Ti5TeO22 thin film using X-ray photoelectron spectroscopy. In: Journal of the European Ceramic Society. 2010 ; Vol. 30, No. 2. pp. 517-520.
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abstract = "Bi6Ti5TeO22 (BTT) thin films were grown on a Pt/Ti/SiO2/Si(1 0 0) substrate under various conditions and the valence state of the Te ion was investigated. For the BTT films grown at 300 °C, most of the Te ions existed as Te4+ ions. However, for the 10 mol{\%} Mn-added BTT films grown at 300 °C, Te6+ ions were found even in the film grown under low oxygen partial pressure (OPP) and their number increased with increasing OPP. This increase was attributed to the presence of Mn2+ ions, which assisted the transition of Te4+ ions to Te6+ ions in order to maintain the charge balance of the Ti4+ sites. Furthermore, in the films grown at 300 °C under a high OPP of 80.0 Pa and subsequently annealed at 600 °C under a high oxygen pressure of 101 kPa, most of the Te ions existed as Te6+ ions. However, for the film grown at 300 °C under low OPP, even though the film was annealed under a high oxygen pressure of 101 kPa, only a few of Te6+ ions were formed, whereas most of Te ions remained as the Te4+ ions.",
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AU - Yoo, Myong Jae

AU - Choi, Jae Hong

AU - Nahm, Sahn

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AU - Kim, Jong Hee

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