Joint characteristics of the YBCO coated conductor (CC) by chemical etching

Hyun Sung Kim; Na Young Kwon; Ki Sung Chang; Tae Kuk Ko; Ho Min Kim; Woo Seok Kim; Chan Park; Haigun Lee

doi:10.1109/TASC.2009.2018854

Joint characteristics of the YBCO coated conductor (CC) by chemical etching

Hyun Sung Kim, Na Young Kwon, Ki Sung Chang, Tae Kuk Ko, Ho Min Kim, Woo Seok Kim, Chan Park, Haigun Lee

Department of Materials Science and Engineering

Research output: Contribution to journal › Article

19 Citations (Scopus)

Abstract

The YBCO coated conductor (CC) is one of the most promising superconductors for various superconducting applications. Although it has many advantages, joints of the YBCO CC are inevitable because there are technical difficulties in lengthening the YBCO CC. In the joining process, it is important to reduce the joint resistance between the YBCO CCs in order to operate in a persistent current mode. Several approaches have been proposed to eliminate the stabilizer of the YBCO CC. Among them, this paper introduces a chemical etching method that can reduce the damaging influences to the superconductor layer in the YBCO CC compared with physical or thermal methods, which may degrade the features of the superconductor. This paper discusses the characteristics of joined YBCO CCs in terms of the resistance and critical currents of the joints from the V - t curve.

Original language	English
Article number	5153195
Pages (from-to)	2835-2838
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	19
Issue number	3
DOIs	https://doi.org/10.1109/TASC.2009.2018854
Publication status	Published - 2009 Jun 1

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Keywords

Etching
Joint
Stabilizer
YBCO coated conductor (CC)

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics
Electronic, Optical and Magnetic Materials

Cite this

Kim, H. S., Kwon, N. Y., Chang, K. S., Ko, T. K., Kim, H. M., Kim, W. S., Park, C., & Lee, H. (2009). Joint characteristics of the YBCO coated conductor (CC) by chemical etching. IEEE Transactions on Applied Superconductivity, 19(3), 2835-2838. [5153195]. https://doi.org/10.1109/TASC.2009.2018854

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10.1109/TASC.2009.2018854