Lateral composition modulation in GaP/InP short-period superlattices grown by solid source molecular beam epitaxy

Jin Dong Song; Young Woo Ok; Jong Min Kim; Yong Tak Lee; Tae Yeon Seong

doi:10.1063/1.1412267

Lateral composition modulation in GaP/InP short-period superlattices grown by solid source molecular beam epitaxy

Jin Dong Song, Young Woo Ok, Jong Min Kim, Yong Tak Lee, Tae Yeon Seong

Research output: Contribution to journal › Article

18 Citations (Scopus)

Abstract

Transmission electron microscopy (TEM) is employed to investigate the structural properties of (GaP)/(InP) short-period superlattices (SPS) grown at temperatures in the range of 425-490 °C by solid source molecular beam epitaxy. TEM results show that lateral composition modulation (LCM) is formed in the SPS layers grown at temperatures above 460 °C. Transmission electron diffraction results show that CuPt ordering occurs in all samples. It is shown that the degree of order increases, reaches a maximum at 460 °C, and then decreases, as the growth temperature increases. Photoluminescence examination (at 9 K) shows that the samples experience a reduction in band gap, which is in the range of 55-221 meV, as the growth temperature increases. The reduction is attributed to the combined effects of the LCM and CuPt-type ordering.

Original language	English
Pages (from-to)	5086-5089
Number of pages	4
Journal	Journal of Applied Physics
Volume	90
Issue number	10
DOIs	https://doi.org/10.1063/1.1412267
Publication status	Published - 2001 Nov 15
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.1412267

Fingerprint Dive into the research topics of 'Lateral composition modulation in GaP/InP short-period superlattices grown by solid source molecular beam epitaxy'. Together they form a unique fingerprint.

Cite this

Song, J. D., Ok, Y. W., Kim, J. M., Lee, Y. T., & Seong, T. Y. (2001). Lateral composition modulation in GaP/InP short-period superlattices grown by solid source molecular beam epitaxy. Journal of Applied Physics, 90(10), 5086-5089. https://doi.org/10.1063/1.1412267

@article{a73dc54abc944a7b99ad472e7b4f7133,

title = "Lateral composition modulation in GaP/InP short-period superlattices grown by solid source molecular beam epitaxy",

abstract = "Transmission electron microscopy (TEM) is employed to investigate the structural properties of (GaP)/(InP) short-period superlattices (SPS) grown at temperatures in the range of 425-490 °C by solid source molecular beam epitaxy. TEM results show that lateral composition modulation (LCM) is formed in the SPS layers grown at temperatures above 460 °C. Transmission electron diffraction results show that CuPt ordering occurs in all samples. It is shown that the degree of order increases, reaches a maximum at 460 °C, and then decreases, as the growth temperature increases. Photoluminescence examination (at 9 K) shows that the samples experience a reduction in band gap, which is in the range of 55-221 meV, as the growth temperature increases. The reduction is attributed to the combined effects of the LCM and CuPt-type ordering.",

author = "Song, {Jin Dong} and Ok, {Young Woo} and Kim, {Jong Min} and Lee, {Yong Tak} and Seong, {Tae Yeon}",

year = "2001",

month = nov,

day = "15",

doi = "10.1063/1.1412267",

language = "English",

volume = "90",

pages = "5086--5089",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "10",

}

TY - JOUR

T1 - Lateral composition modulation in GaP/InP short-period superlattices grown by solid source molecular beam epitaxy

AU - Song, Jin Dong

AU - Ok, Young Woo

AU - Kim, Jong Min

AU - Lee, Yong Tak

AU - Seong, Tae Yeon

PY - 2001/11/15

Y1 - 2001/11/15

N2 - Transmission electron microscopy (TEM) is employed to investigate the structural properties of (GaP)/(InP) short-period superlattices (SPS) grown at temperatures in the range of 425-490 °C by solid source molecular beam epitaxy. TEM results show that lateral composition modulation (LCM) is formed in the SPS layers grown at temperatures above 460 °C. Transmission electron diffraction results show that CuPt ordering occurs in all samples. It is shown that the degree of order increases, reaches a maximum at 460 °C, and then decreases, as the growth temperature increases. Photoluminescence examination (at 9 K) shows that the samples experience a reduction in band gap, which is in the range of 55-221 meV, as the growth temperature increases. The reduction is attributed to the combined effects of the LCM and CuPt-type ordering.

AB - Transmission electron microscopy (TEM) is employed to investigate the structural properties of (GaP)/(InP) short-period superlattices (SPS) grown at temperatures in the range of 425-490 °C by solid source molecular beam epitaxy. TEM results show that lateral composition modulation (LCM) is formed in the SPS layers grown at temperatures above 460 °C. Transmission electron diffraction results show that CuPt ordering occurs in all samples. It is shown that the degree of order increases, reaches a maximum at 460 °C, and then decreases, as the growth temperature increases. Photoluminescence examination (at 9 K) shows that the samples experience a reduction in band gap, which is in the range of 55-221 meV, as the growth temperature increases. The reduction is attributed to the combined effects of the LCM and CuPt-type ordering.

UR - http://www.scopus.com/inward/record.url?scp=0038571923&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0038571923&partnerID=8YFLogxK

U2 - 10.1063/1.1412267

DO - 10.1063/1.1412267

M3 - Article

AN - SCOPUS:0038571923

VL - 90

SP - 5086

EP - 5089

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 10

ER -