Abstract
Transmission electron microscopy (TEM) is employed to investigate the structural properties of (GaP)/(InP) short-period superlattices (SPS) grown at temperatures in the range of 425-490 °C by solid source molecular beam epitaxy. TEM results show that lateral composition modulation (LCM) is formed in the SPS layers grown at temperatures above 460 °C. Transmission electron diffraction results show that CuPt ordering occurs in all samples. It is shown that the degree of order increases, reaches a maximum at 460 °C, and then decreases, as the growth temperature increases. Photoluminescence examination (at 9 K) shows that the samples experience a reduction in band gap, which is in the range of 55-221 meV, as the growth temperature increases. The reduction is attributed to the combined effects of the LCM and CuPt-type ordering.
| Original language | English |
|---|---|
| Pages (from-to) | 5086-5089 |
| Number of pages | 4 |
| Journal | Journal of Applied Physics |
| Volume | 90 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 2001 Nov 15 |
| Externally published | Yes |
Fingerprint
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physics and Astronomy (miscellaneous)
Cite this
Lateral composition modulation in GaP/InP short-period superlattices grown by solid source molecular beam epitaxy. / Song, Jin Dong; Ok, Young Woo; Kim, Jong Min; Lee, Yong Tak; Seong, Tae Yeon.
In: Journal of Applied Physics, Vol. 90, No. 10, 15.11.2001, p. 5086-5089.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Lateral composition modulation in GaP/InP short-period superlattices grown by solid source molecular beam epitaxy
AU - Song, Jin Dong
AU - Ok, Young Woo
AU - Kim, Jong Min
AU - Lee, Yong Tak
AU - Seong, Tae Yeon
PY - 2001/11/15
Y1 - 2001/11/15
N2 - Transmission electron microscopy (TEM) is employed to investigate the structural properties of (GaP)/(InP) short-period superlattices (SPS) grown at temperatures in the range of 425-490 °C by solid source molecular beam epitaxy. TEM results show that lateral composition modulation (LCM) is formed in the SPS layers grown at temperatures above 460 °C. Transmission electron diffraction results show that CuPt ordering occurs in all samples. It is shown that the degree of order increases, reaches a maximum at 460 °C, and then decreases, as the growth temperature increases. Photoluminescence examination (at 9 K) shows that the samples experience a reduction in band gap, which is in the range of 55-221 meV, as the growth temperature increases. The reduction is attributed to the combined effects of the LCM and CuPt-type ordering.
AB - Transmission electron microscopy (TEM) is employed to investigate the structural properties of (GaP)/(InP) short-period superlattices (SPS) grown at temperatures in the range of 425-490 °C by solid source molecular beam epitaxy. TEM results show that lateral composition modulation (LCM) is formed in the SPS layers grown at temperatures above 460 °C. Transmission electron diffraction results show that CuPt ordering occurs in all samples. It is shown that the degree of order increases, reaches a maximum at 460 °C, and then decreases, as the growth temperature increases. Photoluminescence examination (at 9 K) shows that the samples experience a reduction in band gap, which is in the range of 55-221 meV, as the growth temperature increases. The reduction is attributed to the combined effects of the LCM and CuPt-type ordering.
UR - http://www.scopus.com/inward/record.url?scp=0038571923&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0038571923&partnerID=8YFLogxK
U2 - 10.1063/1.1412267
DO - 10.1063/1.1412267
M3 - Article
AN - SCOPUS:0038571923
VL - 90
SP - 5086
EP - 5089
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 10
ER -