Lateral force microscopy investigations of the crystallization of SrBi2Ta2O9 thin films

Kwang Bae Lee, Byeong Kwon Ju

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A lateral force microscope (LFM) was used for studying the surface morphologies of SrBi2Ta2O9 thin films with varying post-annealing temperature. Specimens were prepared onto platinized silicon wafers by the sol-gel method and post-annealed at 600-800°C. Non-ferroelectric matrix phases were found for specimens annealed below 700°C, which were confirmed by the measurement of X-ray diffraction (XRD) patterns. The friction coefficients between the surface of ferroelectric grain and non-ferroelectric matrix, and the silicon nitride tip, were determined from the line profile of the LFM images. The measured coefficients of friction for a tip on grain and matrix are 0.19±0.08 and 0.28±0.08, respectively. In the LFM images, the matrix phases decreased with increasing post-anneal temperature and the surfaces of the specimens annealed above 700°C were filled with SBT grains which were consistent with the XRD results. Ferroelectricities of these specimens were confirmed by the measurement of polarization field hysteresis loops.

Original languageEnglish
Pages (from-to)65-70
Number of pages6
JournalThin Solid Films
Volume334
Issue number1-2
Publication statusPublished - 1998 Dec 4
Externally publishedYes

Fingerprint

Crystallization
Microscopic examination
crystallization
microscopy
Thin films
Microscopes
microscopes
matrices
thin films
coefficient of friction
Friction
Ferroelectricity
X ray diffraction
ferroelectricity
Hysteresis loops
Silicon nitride
Silicon wafers
silicon nitrides
Diffraction patterns
Sol-gel process

Keywords

  • Crystallization
  • Lateral force microscopy
  • SrBiTaO thin film
  • X-ray diffraction

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Lateral force microscopy investigations of the crystallization of SrBi2Ta2O9 thin films. / Lee, Kwang Bae; Ju, Byeong Kwon.

In: Thin Solid Films, Vol. 334, No. 1-2, 04.12.1998, p. 65-70.

Research output: Contribution to journalArticle

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