Length dependence of charge transport in nanoscopic molecular junctions incorporating a series of rigid thiol-terminated norbornylogs

Jeremy M. Beebe, Vincent B. Engelkes, Jingquan Liu, J. Justin Gooding, Paul K. Eggers, Yongseok Jun, Xiaoyang Zhu, Michael N. Paddon-Row, C. Daniel Frisbie

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

Four tetrathiol-terminated norbornane homologues were synthesized and self-assembled monolayers (SAMs) of these molecules were formed on Au via adsorption from CH 2Cl 2. SAMs were characterized structurally via spectroscopic ellipsometry (SE), reflection-absorption infrared spectroscopy (RAIRS), Rutherford backscattering spectrometry (RBS), and X-ray photoelectron spectroscopy (XPS). Results of these analyses show that the rigid norbornylogs form monolayers that have a surface coverage slightly lower than that of alkanethiols, and that they exhibit a nonmonotonic dependence of film thickness on molecular length. Nanoscale molecular junctions incorporating these SAMs were formed and characterized electrically using conducting probe atomic force microscopy (CP-AFM). The resistances of these junctions scale exponentially with the contour length of the molecules, with β = 0.9 Å -1, consistent with a nonresonant tunneling mechanism. Further, the resistance of norbornyl SAMs correlates well with the resistance of alkanedithiol SAMs of similar length, suggesting that the norbornyl molecules form sulfur-metal bonds on both ends of the junction.

Original languageEnglish
Pages (from-to)5207-5215
Number of pages9
JournalJournal of Physical Chemistry B
Volume109
Issue number11
DOIs
Publication statusPublished - 2005 Mar 24
Externally publishedYes

Fingerprint

Self assembled monolayers
Sulfhydryl Compounds
thiols
Charge transfer
Spectrum Analysis
Norbornanes
Photoelectron Spectroscopy
Atomic Force Microscopy
Sulfur
Adsorption
molecules
Metals
Molecules
ellipsometry
backscattering
absorption spectroscopy
film thickness
sulfur
infrared spectroscopy
photoelectron spectroscopy

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Length dependence of charge transport in nanoscopic molecular junctions incorporating a series of rigid thiol-terminated norbornylogs. / Beebe, Jeremy M.; Engelkes, Vincent B.; Liu, Jingquan; Gooding, J. Justin; Eggers, Paul K.; Jun, Yongseok; Zhu, Xiaoyang; Paddon-Row, Michael N.; Frisbie, C. Daniel.

In: Journal of Physical Chemistry B, Vol. 109, No. 11, 24.03.2005, p. 5207-5215.

Research output: Contribution to journalArticle

Beebe, JM, Engelkes, VB, Liu, J, Gooding, JJ, Eggers, PK, Jun, Y, Zhu, X, Paddon-Row, MN & Frisbie, CD 2005, 'Length dependence of charge transport in nanoscopic molecular junctions incorporating a series of rigid thiol-terminated norbornylogs', Journal of Physical Chemistry B, vol. 109, no. 11, pp. 5207-5215. https://doi.org/10.1021/jp044630p
Beebe, Jeremy M. ; Engelkes, Vincent B. ; Liu, Jingquan ; Gooding, J. Justin ; Eggers, Paul K. ; Jun, Yongseok ; Zhu, Xiaoyang ; Paddon-Row, Michael N. ; Frisbie, C. Daniel. / Length dependence of charge transport in nanoscopic molecular junctions incorporating a series of rigid thiol-terminated norbornylogs. In: Journal of Physical Chemistry B. 2005 ; Vol. 109, No. 11. pp. 5207-5215.
@article{461de34dc7c44b9b9a374e6b158e2b38,
title = "Length dependence of charge transport in nanoscopic molecular junctions incorporating a series of rigid thiol-terminated norbornylogs",
abstract = "Four tetrathiol-terminated norbornane homologues were synthesized and self-assembled monolayers (SAMs) of these molecules were formed on Au via adsorption from CH 2Cl 2. SAMs were characterized structurally via spectroscopic ellipsometry (SE), reflection-absorption infrared spectroscopy (RAIRS), Rutherford backscattering spectrometry (RBS), and X-ray photoelectron spectroscopy (XPS). Results of these analyses show that the rigid norbornylogs form monolayers that have a surface coverage slightly lower than that of alkanethiols, and that they exhibit a nonmonotonic dependence of film thickness on molecular length. Nanoscale molecular junctions incorporating these SAMs were formed and characterized electrically using conducting probe atomic force microscopy (CP-AFM). The resistances of these junctions scale exponentially with the contour length of the molecules, with β = 0.9 {\AA} -1, consistent with a nonresonant tunneling mechanism. Further, the resistance of norbornyl SAMs correlates well with the resistance of alkanedithiol SAMs of similar length, suggesting that the norbornyl molecules form sulfur-metal bonds on both ends of the junction.",
author = "Beebe, {Jeremy M.} and Engelkes, {Vincent B.} and Jingquan Liu and Gooding, {J. Justin} and Eggers, {Paul K.} and Yongseok Jun and Xiaoyang Zhu and Paddon-Row, {Michael N.} and Frisbie, {C. Daniel}",
year = "2005",
month = "3",
day = "24",
doi = "10.1021/jp044630p",
language = "English",
volume = "109",
pages = "5207--5215",
journal = "Journal of Physical Chemistry B Materials",
issn = "1520-6106",
publisher = "American Chemical Society",
number = "11",

}

TY - JOUR

T1 - Length dependence of charge transport in nanoscopic molecular junctions incorporating a series of rigid thiol-terminated norbornylogs

AU - Beebe, Jeremy M.

AU - Engelkes, Vincent B.

AU - Liu, Jingquan

AU - Gooding, J. Justin

AU - Eggers, Paul K.

AU - Jun, Yongseok

AU - Zhu, Xiaoyang

AU - Paddon-Row, Michael N.

AU - Frisbie, C. Daniel

PY - 2005/3/24

Y1 - 2005/3/24

N2 - Four tetrathiol-terminated norbornane homologues were synthesized and self-assembled monolayers (SAMs) of these molecules were formed on Au via adsorption from CH 2Cl 2. SAMs were characterized structurally via spectroscopic ellipsometry (SE), reflection-absorption infrared spectroscopy (RAIRS), Rutherford backscattering spectrometry (RBS), and X-ray photoelectron spectroscopy (XPS). Results of these analyses show that the rigid norbornylogs form monolayers that have a surface coverage slightly lower than that of alkanethiols, and that they exhibit a nonmonotonic dependence of film thickness on molecular length. Nanoscale molecular junctions incorporating these SAMs were formed and characterized electrically using conducting probe atomic force microscopy (CP-AFM). The resistances of these junctions scale exponentially with the contour length of the molecules, with β = 0.9 Å -1, consistent with a nonresonant tunneling mechanism. Further, the resistance of norbornyl SAMs correlates well with the resistance of alkanedithiol SAMs of similar length, suggesting that the norbornyl molecules form sulfur-metal bonds on both ends of the junction.

AB - Four tetrathiol-terminated norbornane homologues were synthesized and self-assembled monolayers (SAMs) of these molecules were formed on Au via adsorption from CH 2Cl 2. SAMs were characterized structurally via spectroscopic ellipsometry (SE), reflection-absorption infrared spectroscopy (RAIRS), Rutherford backscattering spectrometry (RBS), and X-ray photoelectron spectroscopy (XPS). Results of these analyses show that the rigid norbornylogs form monolayers that have a surface coverage slightly lower than that of alkanethiols, and that they exhibit a nonmonotonic dependence of film thickness on molecular length. Nanoscale molecular junctions incorporating these SAMs were formed and characterized electrically using conducting probe atomic force microscopy (CP-AFM). The resistances of these junctions scale exponentially with the contour length of the molecules, with β = 0.9 Å -1, consistent with a nonresonant tunneling mechanism. Further, the resistance of norbornyl SAMs correlates well with the resistance of alkanedithiol SAMs of similar length, suggesting that the norbornyl molecules form sulfur-metal bonds on both ends of the junction.

UR - http://www.scopus.com/inward/record.url?scp=15744368800&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=15744368800&partnerID=8YFLogxK

U2 - 10.1021/jp044630p

DO - 10.1021/jp044630p

M3 - Article

C2 - 16863186

AN - SCOPUS:15744368800

VL - 109

SP - 5207

EP - 5215

JO - Journal of Physical Chemistry B Materials

JF - Journal of Physical Chemistry B Materials

SN - 1520-6106

IS - 11

ER -