Less mobility degradation induced by transverse electric-field in junctionless transistors

So Jeong Park, Dae Young Jeon, Laurent Montes, Mireille Mouis, Sylvain Barraud, Gyu Tae Kim, Gérard Ghibaudo

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Less mobility degradation induced by transverse electric-field in junctionless transistors'. Together they form a unique fingerprint.

Physics & Astronomy