Lifetime analysis for comparing POCl3 diffused emitter doping characteristics in p-type silicon solar cells using QSSPC

Hyun Jung Park, Soo Min Kim, Sujeong Jeong, Seung Hyun Shin, Hyomin Park, Yoon Mook Kang, Haeseok Lee, Donghwan Kim

Research output: Contribution to journalArticle

Abstract

Analysis of the emitter property of solar cells is important because the emitter doping characteristics can affect the surface recombination velocity, contact resistance, emitter saturation current density, and cell efficiency. To analyze the emitter quality, we used the following methods: the four-point probe method, quasi-steady-state photoconductance (QSSPC), and secondary ion mass spectroscopy (SIMS). The four-point probe method is used to measure the doping dose in the emitter. Using QSSPC, we can characterize the emitter quality, including the lifetime of the emitter, and using SIMS, we can measure the concentration of dopants as a function of depth in the emitter. However, SIMS measurement is destructive and limited to the measurement of planar surface wafers. To solve this problem, we investigated the relationship between the minority carrier lifetime and the emitter doping profile using the QSSPC. The relationship between the lifetime and emitter doping profile showed that the lifetime of the emitter decreases as the emitter doping concentration increases. From this result, we performed a lifetime analysis for differently doped POCl3-diffused emitters. The results obtained using the theoretical model for the lifetime agreed with experimental SIMS measurement results, indicating that the model can be used as a quantitative model for comparing emitter doping characteristics.

Original languageEnglish
Pages (from-to)4914-4919
Number of pages6
JournalJournal of Nanoscience and Nanotechnology
Volume17
Issue number7
DOIs
Publication statusPublished - 2017

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Secondary Ion Mass Spectrometry
quasi-steady states
Silicon solar cells
Silicon
emitters
solar cells
Doping (additives)
life (durability)
Spectroscopy
Ions
Genetic Recombination
mass spectroscopy
Theoretical Models
Cell Count
Carrier lifetime
Contact resistance
Solar cells
ions
Current density
carrier lifetime

Keywords

  • Auger Recombination.
  • Doping Concentration
  • Minority Carrier Lifetime
  • P-Type Silicon Solar Cell
  • Phosphorus Emitter
  • POCl
  • QSSPC

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Biomedical Engineering
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Lifetime analysis for comparing POCl3 diffused emitter doping characteristics in p-type silicon solar cells using QSSPC. / Park, Hyun Jung; Kim, Soo Min; Jeong, Sujeong; Shin, Seung Hyun; Park, Hyomin; Kang, Yoon Mook; Lee, Haeseok; Kim, Donghwan.

In: Journal of Nanoscience and Nanotechnology, Vol. 17, No. 7, 2017, p. 4914-4919.

Research output: Contribution to journalArticle

Park, Hyun Jung ; Kim, Soo Min ; Jeong, Sujeong ; Shin, Seung Hyun ; Park, Hyomin ; Kang, Yoon Mook ; Lee, Haeseok ; Kim, Donghwan. / Lifetime analysis for comparing POCl3 diffused emitter doping characteristics in p-type silicon solar cells using QSSPC. In: Journal of Nanoscience and Nanotechnology. 2017 ; Vol. 17, No. 7. pp. 4914-4919.
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