Abstract
Simple and efficient lifetime modeling of organic light emitting diodes (OLED) are suggested by in-situ successive AC/DC measurements with reinforcement assessments of machine learning. AC/DC device parameters of phosphorescent OLED devices with multiple transport layers are monitored and analyzed by third-order parallel R//C circuit model with deep learning algorithm. The prediction efficiency of the lifetime assessment is enhanced by combining in-situ AC/DC device parameters, reducing the assessment time compared to conventional constant-stress test methods.
Original language | English |
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Article number | 106404 |
Journal | Organic Electronics |
Volume | 101 |
DOIs | |
Publication status | Published - 2022 Feb |
Keywords
- 4,4′-N,N′-dicarbazole-biphenyl (CBP)
- Automatic successive measurements
- Compact modeling
- Deep learning
- Lifetime assessment
- OLEDs
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Biomaterials
- Chemistry(all)
- Condensed Matter Physics
- Materials Chemistry
- Electrical and Electronic Engineering