Lifetime prediction model of thermal fatigue stress on crystalline silicon photovoltaic module

Nochang Park; Changwoon Han; Jaeseong Jeong; Donghwan Kim

doi:10.1109/PVSC.2013.6744446

Lifetime prediction model of thermal fatigue stress on crystalline silicon photovoltaic module

Nochang Park, Changwoon Han, Jaeseong Jeong, Donghwan Kim

Department of Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

Thermal cycling stress can result in fatigue cracks of interconnections between ribbon wires and the metallization of a photovoltaic (PV) module, thereby increasing its series resistance. Therefore, in this study, the thermal cycling (TC) history of PV modules exposed to two benchmark climate (Phoenix, AZ) has been derived employing corresponding meteorological data. Using the three parameters rain-flow counting algorithm, the number of TCs versus temperature change was calculated over one year. The number of rain-flow cycles was 935 in Phoenix. Furthermore, three types of accelerated tests were conducted to develop a lifetime prediction model. The Basquin equation was used to predict the number of cycles to failure, based on stress calculation. A finite element model for stress analysis was developed. Failure analysis shows that crack occurred at the solder joint after accelerated test.

Original language	English
Title of host publication	39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1575-1578
Number of pages	4
ISBN (Print)	9781479932993
DOIs	https://doi.org/10.1109/PVSC.2013.6744446
Publication status	Published - 2013
Event	39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States Duration: 2013 Jun 16 → 2013 Jun 21

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Country/Territory	United States
City	Tampa, FL
Period	13/6/16 → 13/6/21

Keywords

Accelerated test
Fatigue
Lifetime
PV module
Solder joint

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/PVSC.2013.6744446

Cite this

Park, N., Han, C., Jeong, J., & Kim, D. (2013). Lifetime prediction model of thermal fatigue stress on crystalline silicon photovoltaic module. In 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 (pp. 1575-1578). [6744446] (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2013.6744446

Lifetime prediction model of thermal fatigue stress on crystalline silicon photovoltaic module. / Park, Nochang; Han, Changwoon; Jeong, Jaeseong et al.

39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc., 2013. p. 1575-1578 6744446 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Park, N, Han, C, Jeong, J & Kim, D 2013, Lifetime prediction model of thermal fatigue stress on crystalline silicon photovoltaic module. in 39th IEEE Photovoltaic Specialists Conference, PVSC 2013., 6744446, Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., pp. 1575-1578, 39th IEEE Photovoltaic Specialists Conference, PVSC 2013, Tampa, FL, United States, 13/6/16. https://doi.org/10.1109/PVSC.2013.6744446

Park N, Han C, Jeong J, Kim D. Lifetime prediction model of thermal fatigue stress on crystalline silicon photovoltaic module. In 39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc. 2013. p. 1575-1578. 6744446. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2013.6744446

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abstract = "Thermal cycling stress can result in fatigue cracks of interconnections between ribbon wires and the metallization of a photovoltaic (PV) module, thereby increasing its series resistance. Therefore, in this study, the thermal cycling (TC) history of PV modules exposed to two benchmark climate (Phoenix, AZ) has been derived employing corresponding meteorological data. Using the three parameters rain-flow counting algorithm, the number of TCs versus temperature change was calculated over one year. The number of rain-flow cycles was 935 in Phoenix. Furthermore, three types of accelerated tests were conducted to develop a lifetime prediction model. The Basquin equation was used to predict the number of cycles to failure, based on stress calculation. A finite element model for stress analysis was developed. Failure analysis shows that crack occurred at the solder joint after accelerated test.",

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Lifetime prediction model of thermal fatigue stress on crystalline silicon photovoltaic module

Abstract

Publication series

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Keywords

ASJC Scopus subject areas

UN SDGs

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