Abstract
As mobile devices are recently equipped with advanced image sensors, it is expected that they would make it possible to diagnose one's skin condition conveniently anywhere and anytime. For this application it is necessary to classify the skin features from a skin image accurately. Although two conventional thresholding methods Otsu and Kapur perform well in a range of applications, we found that they are inappropriate for the specific skin analysis application of our interest. Otsu poorly works for non-bi-modal distributions while Kapur shows poor performance for long-tailed distributions. So, we propose a new line-fitting based thresholding method to detect pigments and pores from a skin image where the image histogram is simply modeled by two lines. Experimental results show that the proposed method finds better threshold which leads to the most visually plausible detection, compared to Otsu and Kapur.
Original language | English |
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Title of host publication | 5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 60-63 |
Number of pages | 4 |
ISBN (Electronic) | 9781479987481 |
DOIs | |
Publication status | Published - 2016 Jan 25 |
Event | 5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015 - Berlin, Germany Duration: 2015 Sept 6 → 2015 Sept 9 |
Other
Other | 5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015 |
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Country/Territory | Germany |
City | Berlin |
Period | 15/9/6 → 15/9/9 |
Keywords
- line-fitting
- pigments
- pores
- segmentation
- skin image
ASJC Scopus subject areas
- Computer Networks and Communications
- Computer Science Applications
- Hardware and Architecture
- Media Technology