Abstract
The effect of Zn-B-O (ZB) glass additions on the sintering temperature and microwave dielectric properties of BaTi4O9 has been investigated using X-ray diffraction, scanning electron microscopy, dilatometry and electrical characterization. It was found that the addition of small amount of glass to BaTi4O9 lowered the sintering temperature to ∼900°C while maintaining good microwave properties. In sintered samples with ZB glass, plate-like abnormal grains (∼5 μm) were observed. ZB glass heat-treated at 900°C for 2 h was crystallized to Zn(BO2)2 and Zn3(BO3)2, which coincides with second phases detected in low-temperature fired BaTi4O9. Thus it can be concluded that there is a negligible reaction forming other second phases between BaTi4O9 and ZB glass. BaTi4O9 ceramics sintered at 900°C for 2 h had good microwave dielectric properties: relative dielectric constant (εr) = 33, quality factor (Qxf) = 27000, and temperature coefficient of resonant frequency (τf) = 7 ppm/°C.
| Original language | English |
|---|---|
| Pages (from-to) | 585-595 |
| Number of pages | 11 |
| Journal | Materials Research Bulletin |
| Volume | 36 |
| Issue number | 3-4 |
| DOIs | |
| Publication status | Published - 2001 Feb 1 |
| Externally published | Yes |
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Keywords
- A. Ceramics
- A. Glasses
- C. Electron microscopy
- C. X-ray diffraction
- D. Dielectric properties
ASJC Scopus subject areas
- Ceramics and Composites
- Materials Chemistry
Cite this
Low-temperature firing and microwave dielectric properties of BaTi4O9 with Zn-B-O glass system. / Kim, Dong-Wan; Lee, Duk Gyu; Hong, Kug Sun.
In: Materials Research Bulletin, Vol. 36, No. 3-4, 01.02.2001, p. 585-595.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Low-temperature firing and microwave dielectric properties of BaTi4O9 with Zn-B-O glass system
AU - Kim, Dong-Wan
AU - Lee, Duk Gyu
AU - Hong, Kug Sun
PY - 2001/2/1
Y1 - 2001/2/1
N2 - The effect of Zn-B-O (ZB) glass additions on the sintering temperature and microwave dielectric properties of BaTi4O9 has been investigated using X-ray diffraction, scanning electron microscopy, dilatometry and electrical characterization. It was found that the addition of small amount of glass to BaTi4O9 lowered the sintering temperature to ∼900°C while maintaining good microwave properties. In sintered samples with ZB glass, plate-like abnormal grains (∼5 μm) were observed. ZB glass heat-treated at 900°C for 2 h was crystallized to Zn(BO2)2 and Zn3(BO3)2, which coincides with second phases detected in low-temperature fired BaTi4O9. Thus it can be concluded that there is a negligible reaction forming other second phases between BaTi4O9 and ZB glass. BaTi4O9 ceramics sintered at 900°C for 2 h had good microwave dielectric properties: relative dielectric constant (εr) = 33, quality factor (Qxf) = 27000, and temperature coefficient of resonant frequency (τf) = 7 ppm/°C.
AB - The effect of Zn-B-O (ZB) glass additions on the sintering temperature and microwave dielectric properties of BaTi4O9 has been investigated using X-ray diffraction, scanning electron microscopy, dilatometry and electrical characterization. It was found that the addition of small amount of glass to BaTi4O9 lowered the sintering temperature to ∼900°C while maintaining good microwave properties. In sintered samples with ZB glass, plate-like abnormal grains (∼5 μm) were observed. ZB glass heat-treated at 900°C for 2 h was crystallized to Zn(BO2)2 and Zn3(BO3)2, which coincides with second phases detected in low-temperature fired BaTi4O9. Thus it can be concluded that there is a negligible reaction forming other second phases between BaTi4O9 and ZB glass. BaTi4O9 ceramics sintered at 900°C for 2 h had good microwave dielectric properties: relative dielectric constant (εr) = 33, quality factor (Qxf) = 27000, and temperature coefficient of resonant frequency (τf) = 7 ppm/°C.
KW - A. Ceramics
KW - A. Glasses
KW - C. Electron microscopy
KW - C. X-ray diffraction
KW - D. Dielectric properties
UR - http://www.scopus.com/inward/record.url?scp=0035245535&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0035245535&partnerID=8YFLogxK
U2 - 10.1016/S0025-5408(01)00551-7
DO - 10.1016/S0025-5408(01)00551-7
M3 - Article
AN - SCOPUS:0035245535
VL - 36
SP - 585
EP - 595
JO - Materials Research Bulletin
JF - Materials Research Bulletin
SN - 0025-5408
IS - 3-4
ER -