Low-voltage, high-performance polymeric field-effect transistors based on self-assembled monolayer-passivated HfOx dielectrics: Correlation between trap density, carrier mobility, and operation voltage

Dae Kyu Kim, Myeongjae Lee, Bong Soo Kim, Jong-Ho Choi

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1 Citation (Scopus)

Abstract

We report on high-performance polymeric field-effect transistors (PFETs) operating at low voltages (Vop) using a self-assembled monolayer (SAM)-passivated HfOx dielectric layer. A diketopyrrolopyrrole and quaterthiophene-based copolymer (PDPP2DT-T2) was spin-coated in air as an active channel material on top of a HfOx gate dielectric that was passivated with n-octyltrichlorosilane (OTS), n-octadecyltrichlorosilane (ODTS), and n-dodecylphosphonic acid (PAC12) SAMs. The high capacitance and low leakage current of the SAM-passivated HfOx dielectrics enabled the devices to operate at |Vop| of less than 4 V. In particular, the PFETs using ODTS-passivated HfOx demonstrated a high hole mobility (μeff h) of 1.98 cm2 V−1 s−1, a current on/off ratio of 1.4 × 104, and a threshold voltage of −0.8 V despite the fact that the device fabrication and all measurements were conducted under ambient conditions without encapsulation. Moreover, the μeff h value observed in this study is the best for high-k-dielectric-based low-voltage PFETs reported to date. This work demonstrates that our facile modification of high-k dielectrics with SAMs is a highly effective method for realizing high-performance semiconducting copolymer-based transistors working at a low Vop regime with low power consumption.

Original languageEnglish
Pages (from-to)135-143
Number of pages9
JournalOrganic Electronics: physics, materials, applications
Volume74
DOIs
Publication statusPublished - 2019 Nov 1

Fingerprint

Carrier mobility
Self assembled monolayers
Field effect transistors
carrier mobility
low voltage
field effect transistors
traps
Electric potential
electric potential
Copolymers
Hole mobility
Gate dielectrics
copolymers
Threshold voltage
Encapsulation
Leakage currents
Transistors
Electric power utilization
Capacitance
hole mobility

Keywords

  • Carrier mobility
  • Conjugated polymers
  • Crystallinity
  • Organic electronics
  • Polymer field effect transistors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry
  • Electrical and Electronic Engineering

Cite this

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title = "Low-voltage, high-performance polymeric field-effect transistors based on self-assembled monolayer-passivated HfOx dielectrics: Correlation between trap density, carrier mobility, and operation voltage",
abstract = "We report on high-performance polymeric field-effect transistors (PFETs) operating at low voltages (Vop) using a self-assembled monolayer (SAM)-passivated HfOx dielectric layer. A diketopyrrolopyrrole and quaterthiophene-based copolymer (PDPP2DT-T2) was spin-coated in air as an active channel material on top of a HfOx gate dielectric that was passivated with n-octyltrichlorosilane (OTS), n-octadecyltrichlorosilane (ODTS), and n-dodecylphosphonic acid (PAC12) SAMs. The high capacitance and low leakage current of the SAM-passivated HfOx dielectrics enabled the devices to operate at |Vop| of less than 4 V. In particular, the PFETs using ODTS-passivated HfOx demonstrated a high hole mobility (μeff h) of 1.98 cm2 V−1 s−1, a current on/off ratio of 1.4 × 104, and a threshold voltage of −0.8 V despite the fact that the device fabrication and all measurements were conducted under ambient conditions without encapsulation. Moreover, the μeff h value observed in this study is the best for high-k-dielectric-based low-voltage PFETs reported to date. This work demonstrates that our facile modification of high-k dielectrics with SAMs is a highly effective method for realizing high-performance semiconducting copolymer-based transistors working at a low Vop regime with low power consumption.",
keywords = "Carrier mobility, Conjugated polymers, Crystallinity, Organic electronics, Polymer field effect transistors",
author = "Kim, {Dae Kyu} and Myeongjae Lee and Kim, {Bong Soo} and Jong-Ho Choi",
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T1 - Low-voltage, high-performance polymeric field-effect transistors based on self-assembled monolayer-passivated HfOx dielectrics

T2 - Correlation between trap density, carrier mobility, and operation voltage

AU - Kim, Dae Kyu

AU - Lee, Myeongjae

AU - Kim, Bong Soo

AU - Choi, Jong-Ho

PY - 2019/11/1

Y1 - 2019/11/1

N2 - We report on high-performance polymeric field-effect transistors (PFETs) operating at low voltages (Vop) using a self-assembled monolayer (SAM)-passivated HfOx dielectric layer. A diketopyrrolopyrrole and quaterthiophene-based copolymer (PDPP2DT-T2) was spin-coated in air as an active channel material on top of a HfOx gate dielectric that was passivated with n-octyltrichlorosilane (OTS), n-octadecyltrichlorosilane (ODTS), and n-dodecylphosphonic acid (PAC12) SAMs. The high capacitance and low leakage current of the SAM-passivated HfOx dielectrics enabled the devices to operate at |Vop| of less than 4 V. In particular, the PFETs using ODTS-passivated HfOx demonstrated a high hole mobility (μeff h) of 1.98 cm2 V−1 s−1, a current on/off ratio of 1.4 × 104, and a threshold voltage of −0.8 V despite the fact that the device fabrication and all measurements were conducted under ambient conditions without encapsulation. Moreover, the μeff h value observed in this study is the best for high-k-dielectric-based low-voltage PFETs reported to date. This work demonstrates that our facile modification of high-k dielectrics with SAMs is a highly effective method for realizing high-performance semiconducting copolymer-based transistors working at a low Vop regime with low power consumption.

AB - We report on high-performance polymeric field-effect transistors (PFETs) operating at low voltages (Vop) using a self-assembled monolayer (SAM)-passivated HfOx dielectric layer. A diketopyrrolopyrrole and quaterthiophene-based copolymer (PDPP2DT-T2) was spin-coated in air as an active channel material on top of a HfOx gate dielectric that was passivated with n-octyltrichlorosilane (OTS), n-octadecyltrichlorosilane (ODTS), and n-dodecylphosphonic acid (PAC12) SAMs. The high capacitance and low leakage current of the SAM-passivated HfOx dielectrics enabled the devices to operate at |Vop| of less than 4 V. In particular, the PFETs using ODTS-passivated HfOx demonstrated a high hole mobility (μeff h) of 1.98 cm2 V−1 s−1, a current on/off ratio of 1.4 × 104, and a threshold voltage of −0.8 V despite the fact that the device fabrication and all measurements were conducted under ambient conditions without encapsulation. Moreover, the μeff h value observed in this study is the best for high-k-dielectric-based low-voltage PFETs reported to date. This work demonstrates that our facile modification of high-k dielectrics with SAMs is a highly effective method for realizing high-performance semiconducting copolymer-based transistors working at a low Vop regime with low power consumption.

KW - Carrier mobility

KW - Conjugated polymers

KW - Crystallinity

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KW - Polymer field effect transistors

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