M-DTM: Migration-based dynamic thermal management for heterogeneous mobile multi-core processors

Young Geun Kim, Minyong Kim, Jae Min Kim, Sung Woo Jung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

Recently, mobile devices have employed heterogeneous multi-core processors which consist of highperformance big cores and low-power small cores. In heterogeneous mobile multi-core processors, the conventional DVFS (Dynamic Voltage and Frequency Scaling)-based DTM (Dynamic Thermal Management) is still adopted; it does not actively utilize the small cores to resolve thermal problem. In this paper, we propose M-DTM (Migration-based DTM) for heterogeneous mobile multi-core processors. In case of thermal emergency of the big cores, M-DTM migrates applications to the small cores instead of lowering the voltage and frequency of the big cores. In this way, M-DTM allows more time for the applications to run at the highest frequency of the big cores by cooling down the big cores more rapidly, compared to the conventional DTM. Through real measurement, we show that M-DTM improves performance by 10.6% and saves system-wide energy (not CPU energy) by 3.6%, on average, compared to the conventional DTM.

Original languageEnglish
Title of host publicationProceedings -Design, Automation and Test in Europe, DATE
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1533-1538
Number of pages6
Volume2015-April
ISBN (Print)9783981537048
Publication statusPublished - 2015 Apr 22
Event2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 - Grenoble, France
Duration: 2015 Mar 92015 Mar 13

Other

Other2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
CountryFrance
CityGrenoble
Period15/3/915/3/13

ASJC Scopus subject areas

  • Engineering(all)

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    Kim, Y. G., Kim, M., Kim, J. M., & Jung, S. W. (2015). M-DTM: Migration-based dynamic thermal management for heterogeneous mobile multi-core processors. In Proceedings -Design, Automation and Test in Europe, DATE (Vol. 2015-April, pp. 1533-1538). [7092632] Institute of Electrical and Electronics Engineers Inc..