Magnetic and structural properties of (Co1-xFex)Pt thin films

P. W. Jang, D. W. Kim, C. H. Park, J. G. Na, Seong Rae Lee

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

(CO1-xFex)Pt films were grown on a glass substrate by a rf sputtering and then annealed at 650-700°C in a high vacuum. All the as-sputtered (Co1-xFex)Pt films deposited below 400°C had a disordered structure and showed very low coercivities. With increasing the deposition temperature and Fe contents, the (111) texture was weakened in as-deposited (Co1-xFex)Pt ternary films. Vibrating sample magnetometer and x-ray diffraction data show that Co atoms in the L10 CoPt phase were substituted with Fe atoms. In-plane coercivities of these films decreased almost linearly with increasing Fe content which seemed to be due to the decrease of a crystalline anisotropy energy.

Original languageEnglish
Pages (from-to)6614-6616
Number of pages3
JournalJournal of Applied Physics
Volume83
Issue number11
Publication statusPublished - 1998

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magnetic properties
thin films
coercivity
high vacuum
magnetometers
atoms
x ray diffraction
textures
sputtering
anisotropy
glass
temperature
energy

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Jang, P. W., Kim, D. W., Park, C. H., Na, J. G., & Lee, S. R. (1998). Magnetic and structural properties of (Co1-xFex)Pt thin films. Journal of Applied Physics, 83(11), 6614-6616.

Magnetic and structural properties of (Co1-xFex)Pt thin films. / Jang, P. W.; Kim, D. W.; Park, C. H.; Na, J. G.; Lee, Seong Rae.

In: Journal of Applied Physics, Vol. 83, No. 11, 1998, p. 6614-6616.

Research output: Contribution to journalArticle

Jang, PW, Kim, DW, Park, CH, Na, JG & Lee, SR 1998, 'Magnetic and structural properties of (Co1-xFex)Pt thin films', Journal of Applied Physics, vol. 83, no. 11, pp. 6614-6616.
Jang, P. W. ; Kim, D. W. ; Park, C. H. ; Na, J. G. ; Lee, Seong Rae. / Magnetic and structural properties of (Co1-xFex)Pt thin films. In: Journal of Applied Physics. 1998 ; Vol. 83, No. 11. pp. 6614-6616.
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