Magnetotransport properties of dual MgO barrier magnetic tunnel junctions consisting of CoFeB/FeNiSiB/CoFeB free layers

D. K. Kim, J. U. Cho, B. S. Chun, K. H. Shin, K. J. Lee, M. Tsunoda, M. Takahashi, Y. K. Kim

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We report the transport properties of a dual MgO barrier magnetic tunnel junction (DMTJ) where a FeNiSiB layer was inserted in a CoFeB free layer. Upon post-deposition annealing at 330 °C, the tunneling magnetoresistance (TMR) ratio of the DMTJ with a hybrid CoFeB/FeNiSiB/CoFeB free layer reached 195% which is higher than the TMR ratio of 121 from the DMTJ with the single CoFeB free layer. The bias voltage dependence profile was more symmetric for the hybrid case. Boron depth profiling result suggests that the FeNiSiB layer dragged boron atoms more to it rather than letting them diffuse toward CoFeB/MgO interfaces, resulting in improved MTJ performances.

Original languageEnglish
Article number232401
JournalApplied Physics Letters
Volume101
Issue number23
DOIs
Publication statusPublished - 2012 Dec 3

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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