Mapping subsurface structure through atomically thin bismuth films on Si(1 1 1)-(7 × 7) with scanning tunneling microscope

Youngtek Oh, Jungpil Seo, Hwansoo Suh, Jung Seok Seo, Se Jong Kahng, Young Kuk

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We performed scanning tunneling microscopy/spectroscopy measurements and spatial mapping of dI/dV on a few atomic layers of bismuth (Bi) film on a Si(1 1 1)-(7 × 7) substrate. At a Bi coverage of four monolayers (ML), local thickness variation could be measured due to thickness dependence of the surface states. At the nominal coverage of 6.5 ML, the dI/dV map reveals the subsurface structures, such as substrate step edges and buried Bi islands. The subsurface structures could be observed at specific biases, by both the electronic interference in a Bi film and the variation of the Bi surface states as a function of the film thickness.

Original languageEnglish
Pages (from-to)3352-3357
Number of pages6
JournalSurface Science
Volume602
Issue number21
DOIs
Publication statusPublished - 2008 Nov 1

Keywords

  • Bismuth film
  • Scanning tunneling microscopy and spectroscopy
  • Subsurface structure
  • Surface states

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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