Abstract
The characteristic X-rays emitted from materials after gamma ray exposure was simulated and measured. A CdTe semiconductor detector and a 57Co radiation source were used for energy spectroscopy. The types of materials could be identified by comparing the measured energy spectrum with the theoretical X-ray transition energy of the material. The sample composition was represented by the Kα1-line (Siegbahn notations), which has the highest intensity among the characteristic X-rays of each atom. The difference between the theoretic prediction and the experimental result of K-line measurement was < 0.61% even if the characteristic X-rays from several materials were measured simultaneously. 2D images of the mixed materials were acquired with very high selectivity.
Original language | English |
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Pages (from-to) | 426-433 |
Number of pages | 8 |
Journal | Nuclear Engineering and Technology |
Volume | 42 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2010 Aug |
Keywords
- CdTe
- Characteristic X-ray
- Xrf
ASJC Scopus subject areas
- Nuclear Energy and Engineering