Abstract
The characteristic X-rays emitted from materials after gamma ray exposure was simulated and measured. A CdTe semiconductor detector and a 57Co radiation source were used for energy spectroscopy. The types of materials could be identified by comparing the measured energy spectrum with the theoretical X-ray transition energy of the material. The sample composition was represented by the K α1-line (Siegbahn notations), which has the highest intensity among the characteristic X-rays of each atom. The difference between the theoretic prediction and the experimental result of K-line measurement was < 0.61% even if the characteristic X-rays from several materials were measured simultaneously. 2D images of the mixed materials were acquired with very high selectivity.
| Original language | English |
|---|---|
| Pages (from-to) | 426-433 |
| Number of pages | 8 |
| Journal | Nuclear Engineering and Technology |
| Volume | 42 |
| Issue number | 4 |
| Publication status | Published - 2010 Aug 1 |
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Keywords
- CdTe
- Characteristic X-ray
- Xrf
ASJC Scopus subject areas
- Nuclear Energy and Engineering
Cite this
Material investigation and analysis using characteristic X-ray. / Oh, Gyubum; Lee, Won Ho.
In: Nuclear Engineering and Technology, Vol. 42, No. 4, 01.08.2010, p. 426-433.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Material investigation and analysis using characteristic X-ray
AU - Oh, Gyubum
AU - Lee, Won Ho
PY - 2010/8/1
Y1 - 2010/8/1
N2 - The characteristic X-rays emitted from materials after gamma ray exposure was simulated and measured. A CdTe semiconductor detector and a 57Co radiation source were used for energy spectroscopy. The types of materials could be identified by comparing the measured energy spectrum with the theoretical X-ray transition energy of the material. The sample composition was represented by the K α1-line (Siegbahn notations), which has the highest intensity among the characteristic X-rays of each atom. The difference between the theoretic prediction and the experimental result of K-line measurement was < 0.61% even if the characteristic X-rays from several materials were measured simultaneously. 2D images of the mixed materials were acquired with very high selectivity.
AB - The characteristic X-rays emitted from materials after gamma ray exposure was simulated and measured. A CdTe semiconductor detector and a 57Co radiation source were used for energy spectroscopy. The types of materials could be identified by comparing the measured energy spectrum with the theoretical X-ray transition energy of the material. The sample composition was represented by the K α1-line (Siegbahn notations), which has the highest intensity among the characteristic X-rays of each atom. The difference between the theoretic prediction and the experimental result of K-line measurement was < 0.61% even if the characteristic X-rays from several materials were measured simultaneously. 2D images of the mixed materials were acquired with very high selectivity.
KW - CdTe
KW - Characteristic X-ray
KW - Xrf
UR - http://www.scopus.com/inward/record.url?scp=77956943229&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77956943229&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:77956943229
VL - 42
SP - 426
EP - 433
JO - Nuclear Engineering and Technology
JF - Nuclear Engineering and Technology
SN - 1738-5733
IS - 4
ER -