Material investigation and analysis using characteristic X-ray

Gyubum Oh, Won Ho Lee

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The characteristic X-rays emitted from materials after gamma ray exposure was simulated and measured. A CdTe semiconductor detector and a 57Co radiation source were used for energy spectroscopy. The types of materials could be identified by comparing the measured energy spectrum with the theoretical X-ray transition energy of the material. The sample composition was represented by the K α1-line (Siegbahn notations), which has the highest intensity among the characteristic X-rays of each atom. The difference between the theoretic prediction and the experimental result of K-line measurement was < 0.61% even if the characteristic X-rays from several materials were measured simultaneously. 2D images of the mixed materials were acquired with very high selectivity.

Original languageEnglish
Pages (from-to)426-433
Number of pages8
JournalNuclear Engineering and Technology
Volume42
Issue number4
Publication statusPublished - 2010 Aug 1

Fingerprint

X rays
Semiconductor detectors
Gamma rays
Spectroscopy
Radiation
Atoms
Chemical analysis

Keywords

  • CdTe
  • Characteristic X-ray
  • Xrf

ASJC Scopus subject areas

  • Nuclear Energy and Engineering

Cite this

Material investigation and analysis using characteristic X-ray. / Oh, Gyubum; Lee, Won Ho.

In: Nuclear Engineering and Technology, Vol. 42, No. 4, 01.08.2010, p. 426-433.

Research output: Contribution to journalArticle

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