Measurement of loading and loss rates in a magnetooptical trap by direct event counting with atom number feedback

Youngwoon Choi, Seokchan Yoon, Sungsam Kang, Wookrae Kim, Jai Hyung Lee, Kyungwon An

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Measurement of loading and loss rates in a magnetooptical trap by direct event counting with atom number feedback'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science