Measuring the optical permittivity of twodimensional materials without a priori knowledge of electronic transitions

Gwang Hun Jung, Seok Jae Yoo, Q Han Park

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

We propose a deterministic method to measure the optical permittivity of two-dimensional (2D) materials without a priori knowledge of the electronic transitions over the spectral window of interest. Using the thin-film approximation, we show that the ratio of reflection coefficients for s and p polarization can give a unique solution to the permittivity of 2D materials within the measured spectral window. The uniqueness and completeness of our permittivity measurement method do not require a priori knowledge of the electronic transitions of a given material. We experimentally demonstrate that the permittivity of monolayers of MoS2, WS2, and WSe2 in the visible frequency range can be accurately obtained by our method. We believe that our method can provide fast and reliable measurement of the optical permittivity of newly discovered 2D materials. Open Access.

Original languageEnglish
Pages (from-to)263-270
Number of pages8
JournalNanophotonics
Volume8
Issue number2
DOIs
Publication statusPublished - 2018 Jan 1

Keywords

  • Characterization techniques
  • Ellipsometry
  • Optical materials
  • Refractive index
  • Two-dimensional materials

ASJC Scopus subject areas

  • Biotechnology
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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